Studies on the nature of relationships between grain yield and yield-related traits in durum wheat (Triticum durum Desf.) populations

This experiment was conducted at the Field Crops Institute, Agricultural Experimental Station of Setif (ITGC-AES), Eastern semi-arid areas of Algeria, during two successive cropping seasons, 2010/11 and 2011/12. The aim of the study was to evaluate the association of yield and yield-related traits and determine the direct and indirect effects of yield-related traits on grain yield. The plant materials consisted of 330 F3 and 174 F4 durum wheat lines along with their four parents and one control cultivar, which were evaluated under rainfed conditions in a semi-arid region. Data on nine agronomic traits were recorded. Sufficient genetic variability was observed among wheat traits as indicated by the minimum and maximum mean values and confirmed by the phenotypic and genotypic coefficients of variation that took intermediate and high estimates for most of the traits evaluated both in F3 and F4 generations. A high heritability (>60%) was observed for almost all the traits studied indicating the involvement of the additive action of genes in their genetic determinism. Results of stepwise regression and path analysis showed that biological yield, harvest index and number of spikes were the most determinant components of grain yield, exhibiting high positive direct effects (0.697, 0.683 and 0.293 in F3 vs 0.695, 0.205 and 0.560 in F4, respectively) coupled with positive and significant correlations (r=0.696*, r=0.778* and r=0.127* in F3 vs r=0.686*, r=0.628* and r=0.491* in F4, respectively) with this trait. These three yield-contributing traits can be considered as suitable indirect selection criteria to improve grain yield in the subsequent generation of the wheat breeding program.