Measurement of L X-ray production cross sections by impact of protons with energies between 2.5 MeV and 5.0 MeV in selected lanthanoids

Accurate quantitative analysis with particle induced X-ray emission (PIXE) requires an accurate knowledge of the X-ray production cross sections, in particular the L lines. While there are a lot of experimental results, recent reviews have found a disagreement between several previously published pa...

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Veröffentlicht in:Revista mexicana de física 2012-06, Vol.58 (3), p.238-240
Hauptverfasser: Miranda, J., Murillo, G., Méndez, B., López-Monroy, J., Aspiazu, J., Villaseñor, P.
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Sprache:eng ; por
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Zusammenfassung:Accurate quantitative analysis with particle induced X-ray emission (PIXE) requires an accurate knowledge of the X-ray production cross sections, in particular the L lines. While there are a lot of experimental results, recent reviews have found a disagreement between several previously published papers and also by the use of different atomic parameters databases (fluorescence yields and Coster-Kronig transition probabilities). Therefore, it is very convenient to redo some of these cross sections measurements and to extend to other proton energy ranges. Thus, this paper presents results with lanthanoid elements (Ce, Nd, Sm, Eu, Gd, Dy, Ho) irradiated with protons in the energy range 2.5 MeV to 5.0 MeV. The results are compared also with predictions of the ECPSSR theory with the United Atom modification and experimental data of other authors.
ISSN:0035-001X