A novel dual-tone molecular glass resist based on adamantane derivatives for electron beam lithography

A novel molecular glass compound (AD-10Boc) based on adamantane derivatives was synthesized and characterized. The thermal analysis indicated that a glass transition temperature ( T g ) of 80.6 °C and a thermal decomposition temperature ( T d ) up to 150 °C were observed. The X-ray diffraction analy...

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Veröffentlicht in:Journal of materials chemistry. C, Materials for optical and electronic devices Materials for optical and electronic devices, 2022-07, Vol.1 (26), p.9858-9866
Hauptverfasser: Hu, Shengwen, Chen, Jinping, Yu, Tianjun, Zeng, Yi, Wang, Shuangqing, Guo, Xudong, Yang, Guoqiang, Li, Yi
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Sprache:eng
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Zusammenfassung:A novel molecular glass compound (AD-10Boc) based on adamantane derivatives was synthesized and characterized. The thermal analysis indicated that a glass transition temperature ( T g ) of 80.6 °C and a thermal decomposition temperature ( T d ) up to 150 °C were observed. The X-ray diffraction analysis of the powder of AD-10Boc suggests that it exists in an amorphous state at room temperature. The good thermal resistance and film-forming performance of AD-10Boc suggest that it is a candidate for resist materials. AD-10Boc resist was produced by mixing it with minor components of photo-acid generator and other additives. The AD-10Boc resist was demonstrated as a dual-tone (positive and negative tone) resist for electron beam lithography. By optimizing the lithographic performance, the AD-10Boc resist can resolve dense line patterns of 21 nm L/S at 50 μC cm −2 and 30 nm L/S at 100 μC cm −2 for negative-tone and positive-tone development, respectively. This study provides a new example of a dual-tone molecular glass resist fulfilling most of the requirements of EBL. A novel dual-tone molecular glass (AD-10Boc) resist was developed for electron beam lithography. The AD-10Boc resist can resolve dense line patterns of 21 nm and 30 nm L/S for negative-tone and positive-tone development, respectively.
ISSN:2050-7526
2050-7534
DOI:10.1039/d2tc01339h