Photoelectron spectroscopy of cryogenically cooled NiO slow photoelectron velocity-map imaging
High-resolution anion photoelectron spectra of cryogenically cooled NiO 2 anions, obtained using slow photoelectron velocity-map imaging (cryo-SEVI), are presented in tandem with coupled cluster electronic structure calculations including relativistic effects. The experimental spectra encompass the...
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Veröffentlicht in: | Physical chemistry chemical physics : PCCP 2022-07, Vol.24 (29), p.17496-1753 |
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Zusammenfassung: | High-resolution anion photoelectron spectra of cryogenically cooled NiO
2
anions, obtained using slow photoelectron velocity-map imaging (cryo-SEVI), are presented in tandem with coupled cluster electronic structure calculations including relativistic effects. The experimental spectra encompass the X&cmb.tilde;
1
g
+
X&cmb.tilde;
2
g
,
3
Π
g
← X&cmb.tilde;
2
g
, and
1
g
X&cmb.tilde;
2
Π
g
photodetachment transitions of linear ONiO
0/−
, revealing previously unobserved vibrational structure in all three electronic bands. The high-resolution afforded by cryo-SEVI allows for the extraction of vibrational frequencies for each state, consistent with those previously measured in the ground state and in good agreement with scalar-relativistic coupled-cluster calculations. Previously unobserved vibrational structure is observed in the ã
3
Π
g
and Ã
1
Π
g
states and is tentatively assigned. Further, a refined electron affinity of 3.0464(7) eV for NiO
2
is obtained as well as precise term energies for the ã and à states of NiO
2
of 0.3982(7) and 0.7422(10) eV, respectively. Numerous Franck-Condon forbidden transitions involving the doubly degenerate
ν
2
bending mode are observed and ascribed to Herzberg-Teller coupling to an excited electronic state.
High-resolution anion photoelectron spectra of cryogenically cooled NiO
2
−
anions, obtained using slow photoelectron velocity-map imaging (cryo-SEVI), are presented in tandem with coupled cluster electronic structure calculations including relativistic effects. |
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ISSN: | 1463-9076 1463-9084 |
DOI: | 10.1039/d2cp02396b |