Electrochemical impacts complement light scattering techniques for nanoparticle sizing

We show that the electrochemical particle-impact technique (or 'nano-impacts') complements light scattering techniques for sizing both mono- and poly-disperse nanoparticles. It is found that established techniques - Dynamic Light Scattering (DLS) and Nanoparticle Tracking Analysis (NTA) - can accurately measure the diameters of '30 nm' silver particles assuming spherical shapes, but are unable to accurately size a smaller '20 nm' sample. In contrast, nano-impacts have a high accuracy (