Engineering the electronic and magnetic properties of d 2D dichalcogenide materials through vacancy doping and lattice strains

We have systematically investigated the effects of different vacancy defects in 2D d 0 materials SnS 2 and ZrS 2 using first principles calculations. The theoretical results show that the single cation vacancy and the vacancy complex like V-SnS6 can induce large magnetic moments (3−4 μ B ) in these...

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Veröffentlicht in:Physical chemistry chemical physics : PCCP 2016-03, Vol.18 (1), p.7163-7168
Hauptverfasser: Ao, L, Pham, A, Xiao, H. Y, Zu, X. T, Li, S
Format: Artikel
Sprache:eng
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Zusammenfassung:We have systematically investigated the effects of different vacancy defects in 2D d 0 materials SnS 2 and ZrS 2 using first principles calculations. The theoretical results show that the single cation vacancy and the vacancy complex like V-SnS6 can induce large magnetic moments (3−4 μ B ) in these single layer materials. Other defects, such as V-SnS3, V-S, V-ZrS3 and V-ZrS6, can result in n-type conductivity. In addition, the ab initio studies also reveal that the magnetic and conductive properties from the cation vacancy and the defect complex V-SnS6 can be modified using the compressive/tensile strain of the in-plane lattices. Specifically, the V-Zr doped ZrS 2 monolayer can be tuned from a ferromagnetic semiconductor to a metallic/half-metallic material with decreasing/increasing magnetic moments depending on the external compressive/tensile strains. On the other hand, the semiconducting and magnetic properties of V-Sn doped SnS 2 is preserved under different lattice compression and tension. For the defect complex like V-SnS6, only the lattice compression can tune the magnetic moments in SnS 2 . As a result, by manipulating the fabrication parameters, the magnetic and conductive properties of SnS 2 and ZrS 2 can be tuned without the need for chemical doping. The effects of different vacancy defects in 2D d 0 are investigated systematically using first principle methods.
ISSN:1463-9076
1463-9084
DOI:10.1039/c5cp07548c