Capabilities and limitations of LA-ICP-MS for depth resolved analysis of CdTe photovoltaic devicesElectronic supplementary information (ESI) available: Figure: qualitative depth profiles of multi-layer CdTe photovoltaic cells, obtained for a circular laser spot diameter of 65 μm at a laser frequency of: (a) 5 Hz and (b) 1 Hz. In particular, the Sn+ ion signal that represents the SnO2 layer has been removed to show in more detail overlapping between S+ and Na+ ion signals. See DOI: 10.1039/c4ja00

The analytical potential of ArF* excimer Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS) is investigated for fast qualitative depth profile analysis of multi-layer CdTe photovoltaic (PV) devices. Critical parameters ( e.g. laser fluence and laser repetition rate) are evaluate...

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Hauptverfasser: Gutiérrez-González, Ana, González-Gago, Cristina, Pisonero, Jorge, Tibbetts, Nicole, Menéndez, Armando, Vélez, María, Bordel, Nerea
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Sprache:eng
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Zusammenfassung:The analytical potential of ArF* excimer Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS) is investigated for fast qualitative depth profile analysis of multi-layer CdTe photovoltaic (PV) devices. Critical parameters ( e.g. laser fluence and laser repetition rate) are evaluated and optimized to reduce the aerosol mixing from consecutive laser shots and to achieve a low penetration rate. As a result, a high depth resolution (10 s of nm) is demonstrated through the analyses of superficial and embedded coatings. For instance, a layer with a thickness of 100 nm at a depth of 3 μm is successfully measured. Moreover, qualitative profiles of major and minor elements obtained by LA-ICP-MS are validated using reference techniques such as Secondary Ion Mass Spectrometry (SIMS) or Glow Discharge Time of Flight Mass Spectrometry (GD-TOFMS). Additionally, the shape and morphology of the laser-induced craters, after different numbers of laser shots, are investigated using mechanical profilometry and Atomic Force Microscopy (AFM), respectively. The analytical potential of ArF* excimer Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS) is investigated for fast qualitative depth profile analysis of multi-layer CdTe photovoltaic (PV) devices.
ISSN:0267-9477
1364-5544
DOI:10.1039/c4ja00196f