Capabilities and limitations of LA-ICP-MS for depth resolved analysis of CdTe photovoltaic devicesElectronic supplementary information (ESI) available: Figure: qualitative depth profiles of multi-layer CdTe photovoltaic cells, obtained for a circular laser spot diameter of 65 μm at a laser frequency of: (a) 5 Hz and (b) 1 Hz. In particular, the Sn+ ion signal that represents the SnO2 layer has been removed to show in more detail overlapping between S+ and Na+ ion signals. See DOI: 10.1039/c4ja00
The analytical potential of ArF* excimer Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS) is investigated for fast qualitative depth profile analysis of multi-layer CdTe photovoltaic (PV) devices. Critical parameters ( e.g. laser fluence and laser repetition rate) are evaluate...
Gespeichert in:
Hauptverfasser: | , , , , , , |
---|---|
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The analytical potential of ArF* excimer Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS) is investigated for fast qualitative depth profile analysis of multi-layer CdTe photovoltaic (PV) devices. Critical parameters (
e.g.
laser fluence and laser repetition rate) are evaluated and optimized to reduce the aerosol mixing from consecutive laser shots and to achieve a low penetration rate. As a result, a high depth resolution (10 s of nm) is demonstrated through the analyses of superficial and embedded coatings. For instance, a layer with a thickness of 100 nm at a depth of 3 μm is successfully measured. Moreover, qualitative profiles of major and minor elements obtained by LA-ICP-MS are validated using reference techniques such as Secondary Ion Mass Spectrometry (SIMS) or Glow Discharge Time of Flight Mass Spectrometry (GD-TOFMS). Additionally, the shape and morphology of the laser-induced craters, after different numbers of laser shots, are investigated using mechanical profilometry and Atomic Force Microscopy (AFM), respectively.
The analytical potential of ArF* excimer Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS) is investigated for fast qualitative depth profile analysis of multi-layer CdTe photovoltaic (PV) devices. |
---|---|
ISSN: | 0267-9477 1364-5544 |
DOI: | 10.1039/c4ja00196f |