Investigation of the degradation mechanisms of a variety of organic photovoltaic devices by combination of imaging techniquesthe ISOS-3 inter-laboratory collaborationElectronic supplementary information (ESI) available. See DOI: 10.1039/c2ee03508a
The investigation of degradation of seven distinct sets (with a number of individual cells of n 12) of state of the art organic photovoltaic devices prepared by leading research laboratories with a combination of imaging methods is reported. All devices have been shipped to and degraded at Ris DTU u...
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The investigation of degradation of seven distinct sets (with a number of individual cells of
n
12) of state of the art organic photovoltaic devices prepared by leading research laboratories with a combination of imaging methods is reported. All devices have been shipped to and degraded at Ris DTU up to 1830 hours in accordance with established ISOS-3 protocols under defined illumination conditions. Imaging of device function at different stages of degradation was performed by laser-beam induced current (LBIC) scanning; luminescence imaging, specifically photoluminescence (PLI) and electroluminescence (ELI); as well as by lock-in thermography (LIT). Each of the imaging techniques exhibits its specific advantages with respect to sensing certain degradation features, which will be compared and discussed here in detail. As a consequence, a combination of several imaging techniques yields very conclusive information about the degradation processes controlling device function. The large variety of device architectures in turn enables valuable progress in the proper interpretation of imaging resultshence revealing the benefits of this large scale cooperation in making a step forward in the understanding of organic solar cell aging and its interpretation by state-of-the-art imaging methods.
Perfectly matching lock-in thermography (a) and light beam induced current image (b) used for degradation analysis. |
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ISSN: | 1754-5692 1754-5706 |
DOI: | 10.1039/c2ee03508a |