A critical-absorption photometer for the study of the Compton effect

That a change of wave-length occurs in X-ray scattering was first indicated by absorption measurements with the ionisation chamber, which showed that the absorption coefficient of a light element like aluminium was slightly greater for the scattered than for the primary X-rays. Later more conclusive and direct evidence was obtained when spectrometric analysis of the scattered X-rays was made first by the ionisation and afterwards by the photographic method. This analysis disclosed the existence of an unshifted as well as the shifted line, and showed also that the latter becomes relatively more prominent with diminishing wave-length and lower atomic number of the scattering element. After the main features of the Compton effect were established by means of spectrometric measurements, however, absorption measurements with the ionisation method have again been employed for a detailed study of the phenomenon, for such measurements are much quicker than the spectrum experiments, where the final energy available is much smaller on account of the double scattering involved. As mentioned above, the absorption measurements were based on the slight increase in the absorption coefficient of a light element when the wave-length changes from the unmodified to the modified value. The much larger and sudden diminution in absorption of X-rays when the frequency is altered from the short to the long wave-length side of the critical K-absorption limit of the element used as a filter, furnishes us with an easy and convenient method of exhibiting the wave-length change in X-ray scattering. In the present paper will be described a photographic wedge photometer based on this principle, which enables the characteristics of the Compton effect to be readily observed. It may be pointed out that the same idea could no doubt be utilised also in connection with the ionisation measurements of the Compton effect.