Mechanical Amorphization of Chitosan with Different Molecular Weights
Mechanical amorphization of three chitosan samples with high, medium, and low molecular weight was studied. It is shown that there are no significant differences between the course of amorphization process in a planetary ball mill of chitosan with different molecular weights, and the maximum degree...
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Veröffentlicht in: | Polymers 2022-10, Vol.14 (20), p.4438 |
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Sprache: | eng |
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Zusammenfassung: | Mechanical amorphization of three chitosan samples with high, medium, and low molecular weight was studied. It is shown that there are no significant differences between the course of amorphization process in a planetary ball mill of chitosan with different molecular weights, and the maximum degree of amorphization was achieved in 600 s of high intensity mechanical action. Specific energy consumption was 28 kJ/g, being comparable to power consumption for amorphization of cellulose determined previously (29 kJ/g) and 5–7-fold higher than that for amorphization of starch (4–6 kJ/g). Different techniques for determining the crystallinity index (CrI) of chitosan (analysis of the X-ray diffraction (XRD) data, the peak height method, the amorphous standard method, peak deconvolution, and full-profile Rietveld analysis) were compared. The peak height method is characterized by a broader working range but provides deviated CrI values. The peak deconvolution method (with the amorphous Voigt function) makes it possible to calculate the crystallinity index of chitosan with greater accuracy, but the analysis becomes more difficult with samples subjected to mechanical processing. In order to refine the structure and calculation of CrI by the Rietveld method, an attempt to optimize the structure file by the density functional theory (DFT) method was performed. The averaged profile of amorphous chitosan approximated by an eighth-order Fourier model improved the correctness of the description of the amorphous contribution for XRD data processing. The proposed equation may be used as a universal standard model of amorphous chitosan to determine the crystallinity index both for the amorphous standard method and for peak deconvolution of XRD patterns for arbitrary chitosan samples. |
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ISSN: | 2073-4360 2073-4360 |
DOI: | 10.3390/polym14204438 |