Direct observation and manipulation of hot electrons at room temperature

Abstract In modern electronics and optoelectronics, hot electron behaviors are highly concerned, as they determine the performance limit of a device or system, like the associated thermal or power constraint of chips and the Shockley-Queisser limit for solar cell efficiency. To date, however, the ma...

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Veröffentlicht in:National science review 2021-09, Vol.8 (9), p.nwaa295-nwaa295
Hauptverfasser: Wang, Hailu, Wang, Fang, Xia, Hui, Wang, Peng, Li, Tianxin, Li, Juzhu, Wang, Zhen, Sun, Jiamin, Wu, Peisong, Ye, Jiafu, Zhuang, Qiandong, Yang, Zaixing, Fu, Lan, Hu, Weida, Chen, Xiaoshuang, Lu, Wei
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Sprache:eng
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Zusammenfassung:Abstract In modern electronics and optoelectronics, hot electron behaviors are highly concerned, as they determine the performance limit of a device or system, like the associated thermal or power constraint of chips and the Shockley-Queisser limit for solar cell efficiency. To date, however, the manipulation of hot electrons has been mostly based on conceptual interpretations rather than a direct observation. The problem arises from a fundamental fact that energy-differential electrons are mixed up in real-space, making it hard to distinguish them from each other by standard measurements. Here we demonstrate a distinct approach to artificially (spatially) separate hot electrons from cold ones in semiconductor nanowire transistors, which thus offers a unique opportunity to observe and modulate electron occupied state, energy, mobility and even path. Such a process is accomplished through the scanning-photocurrent-microscopy measurements by activating the intervalley-scattering events and 1D charge-neutrality rule. Findings here may provide a new degree of freedom in manipulating non-equilibrium electrons for both electronic and optoelectronic applications. A distinct approach to artificially (spatially) separate hot electrons from cold ones, which thus provides a new degree of freedom in manipulating nonequilibrium electrons for both electronic and optoelectronic applications.
ISSN:2095-5138
2053-714X
DOI:10.1093/nsr/nwaa295