High zT and Its Origin in Sb‐doped GeTe Single Crystals

A record high zT of 2.2 at 740 K is reported in Ge0.92Sb0.08Te single crystals, with an optimal hole carrier concentration ≈4 × 1020 cm−3 that simultaneously maximizes the power factor (PF) ≈56 µW cm−1 K−2 and minimizes the thermal conductivity ≈1.9 Wm−1 K−1. In addition to the presence of herringbone domains and stacking faults, the Ge0.92Sb0.08Te exhibits significant modification to phonon dispersion with an extra phonon excitation around ≈5–6 meV at Γ point of the Brillouin zone as confirmed through inelastic neutron scattering (INS) measurements. Density functional theory (DFT) confirmed this phonon excitation, and predicted another higher energy phonon excitation ≈12–13 meV at W point. These phonon excitations collectively increase the number of phonon decay channels leading to softening of phonon frequencies such that a three‐phonon process is dominant in Ge0.92Sb0.08Te, in contrast to a dominant four‐phonon process in pristine GeTe, highlighting the importance of phonon engineering approaches to improving thermoelectric (TE) performance. The origin of high zT ≈ 2.2 at 740 K of Ge0.92Sb0.08Te is uncovered via DFT and inelastic neutron scattering measurements that reveal the presence of a new phonon band at a transfer energy E ≈5–6 meV, highlighting the importance of phonon engineering approaches to improving thermoelectricperformance.