X‐ray reflecto‐interferometer based on compound refractive lenses

An X‐ray amplitude‐splitting interferometer based on compound refractive lenses, which operates in the reflection mode, is proposed and realized. The idea of a reflecto‐interferometer is to use a very simplified experimental setup where a focused X‐ray beam reflected from parallel flat surfaces creates an interference pattern in a wide angular range. The functional capabilities of the interferometer were experimentally tested at the European Synchrotron Radiation Facility (ESRF) ID06 beamline in the X‐ray energy range from 10 keV to 15 keV. The main features of the proposed approach, high spatial and temporal resolution, were demonstrated experimentally. The reflections from free‐standing Si3N4 membranes, gold and resist layers were studied. Experimentally recorded interferograms are in good agreement with our simulations. The main advantages and future possible applications of the reflecto‐interferometer are discussed. An X‐ray amplitude‐splitting interferometer based on compound refractive lenses, which operates in the reflection mode, is proposed and realized.