Comparison of chemical stability and corrosion resistance of group IV metal oxide films formed by thermal and plasma-enhanced atomic layer deposition
The wide applications of ultrathin group IV metal oxide films (TiO 2 , ZrO 2 and HfO 2 ) probably expose materials to potentially reactive etchants and solvents, appealing for extraordinary chemical stability and corrosion resistance property. In this paper, TiO 2 ultrathin films were deposited on S...
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Veröffentlicht in: | Scientific reports 2019-07, Vol.9 (1), p.10438-12, Article 10438 |
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Sprache: | eng |
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Zusammenfassung: | The wide applications of ultrathin group IV metal oxide films (TiO
2
, ZrO
2
and HfO
2
) probably expose materials to potentially reactive etchants and solvents, appealing for extraordinary chemical stability and corrosion resistance property. In this paper, TiO
2
ultrathin films were deposited on Si at 200 °C while ZrO
2
and HfO
2
were grown at 250 °C to fit their growth temperature window, by thermal atomic layer deposition (TALD) and plasma-enhanced ALD (PEALD). A variety of chemical liquid media including 1 mol/L H
2
SO
4
, 1 mol/L HCl, 1 mol/L KOH, 1 mol/L KCl, and 18 MΩ deionized water were used to test and compare chemical stability of all these as-deposited group IV metal oxides thin films, as well as post-annealed samples at various temperatures. Among these metal oxides, TALD/PEALD HfO
2
ultrathin films exhibit the best chemical stability and anti-corrosion property without any change in thickness after long time immersion into acidic, alkaline and neutral solutions. As-deposited TALD ZrO
2
ultrathin films have slow etch rate of 1.06 nm/day in 1 mol/L HCl, however other PEALD ZrO
2
ultrathin films and annealed TALD ones show better anti-acid stability, indicating the role of introduction of plasma O
2
in PEALD and post-thermal treatment. As-deposited TiO
2
ultrathin films by TALD and PEALD are found to be etched slowly in acidic solutions, but the PEALD can decrease the etching rate of TiO
2
by ~41%. After post-annealing, TiO
2
ultrathin films have satisfactory corrosion resistance, which is ascribed to the crystallization transition from amorphous to anatase phase and the formation of 5% Si-doped TiO
2
ultrathin layers on sample surfaces, i.e. Ti-silicate. ZrO
2
, and TiO
2
ultrathin films show excellent corrosion endurance property in basic and neutral solutions. Simultaneously, 304 stainless steel coated with PEALD-HfO
2
is found to have a lower corrosion rate than that with TALD-HfO
2
by means of electrochemical measurement. The pre-treatment of plasma H
2
to 304 stainless steel can effectively reduce interfacial impurities and porosity of overlayers with significantly enhanced corrosion endurance. Above all, the chemical stability and anti-corrosion properties of IV group metal oxide coatings can be improved by using PEALD technique, post-annealing process and plasma H
2
pre-treatment to substrates. |
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ISSN: | 2045-2322 2045-2322 |
DOI: | 10.1038/s41598-019-47049-z |