Sample delivery for serial crystallography at free‐electron lasers and synchrotrons

The high peak brilliance and femtosecond pulse duration of X‐ray free‐electron lasers (XFELs) provide new scientific opportunities for experiments in physics, chemistry and biology. In structural biology, one of the major applications is serial femtosecond crystallography. The intense XFEL pulse res...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Acta crystallographica. Section D, Biological crystallography. Biological crystallography., 2019-02, Vol.75 (2), p.178-191
Hauptverfasser: Grünbein, Marie Luise, Nass Kovacs, Gabriela
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The high peak brilliance and femtosecond pulse duration of X‐ray free‐electron lasers (XFELs) provide new scientific opportunities for experiments in physics, chemistry and biology. In structural biology, one of the major applications is serial femtosecond crystallography. The intense XFEL pulse results in the destruction of any exposed microcrystal, making serial data collection mandatory. This requires a high‐throughput serial approach to sample delivery. To this end, a number of such sample‐delivery techniques have been developed, some of which have been ported to synchrotron sources, where they allow convenient low‐dose data collection at room temperature. Here, the current sample‐delivery techniques used at XFEL and synchrotron sources are reviewed, with an emphasis on liquid injection and high‐viscosity extrusion, including their application for time‐resolved experiments. The challenges associated with sample delivery at megahertz repetition‐rate XFELs are also outlined. Current developments and challenges for serial sample delivery at synchrotrons and X‐ray free‐electron lasers are reviewed, including the new megahertz repetition‐rate machines, with an emphasis on liquid injection and high‐viscosity extrusion.
ISSN:2059-7983
0907-4449
2059-7983
1399-0047
DOI:10.1107/S205979831801567X