Photon counting performance of amorphous selenium and its dependence on detector structure
Photon counting detectors (PCD) have the potential to improve x-ray imaging; however, they are still hindered by high costs and performance limitations. By using amorphous selenium (a-Se), the cost of PCDs can be significantly reduced compared with modern crystalline semiconductors, and enable large...
Gespeichert in:
Veröffentlicht in: | Journal of medical imaging (Bellingham, Wash.) Wash.), 2018-10, Vol.5 (4), p.043502-043502 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Photon counting detectors (PCD) have the potential to improve x-ray imaging; however, they are still hindered by high costs and performance limitations. By using amorphous selenium (a-Se), the cost of PCDs can be significantly reduced compared with modern crystalline semiconductors, and enable large-area deposition. We are developing a direct conversion field-shaping multiwell avalanche detector (SWAD) to overcome the limitation of low carrier mobility and low charge conversion gain in a-Se. SWAD's dual-grid design creates separate nonavalanche interaction (bulk) and avalanche sensing (well) regions, achieving depth-independent avalanche gain. Unipolar time differential (UTD) charge sensing, combined with tunable avalanche gain in the well region allows for fast response and high charge gain. We developed a probability-based numerical simulation to investigate the impact of UTD charge sensing and avalanche gain on the photon counting performance of different a-Se detector configurations. Pulse height spectra (PHS) for 59.5 and 30 keV photons were simulated. We observed excellent agreement between our model and previously published PHS measurements for a planar detector. The energy resolution significantly improved from 33 keV for the planar detector to
for SWAD. SWAD was found to have a linear response approaching
. |
---|---|
ISSN: | 2329-4302 2329-4310 |
DOI: | 10.1117/1.JMI.5.4.043502 |