A fast image simulation algorithm for scanning transmission electron microscopy
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorit...
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| Veröffentlicht in: | Advanced structural and chemical imaging 2017-05, Vol.3 (1), p.13-11, Article 13 |
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| container_title | Advanced structural and chemical imaging |
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| creator | Ophus, Colin |
| description | Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, namely the Bloch wave and multislice methods. PRISM uses a Fourier interpolation factor
f
that has typical values of 4–20 for atomic resolution simulations. We show that in many cases PRISM can provide a speedup that scales with
f
4
compared to multislice simulations, with a negligible loss of accuracy. We demonstrate the usefulness of this method with large-scale scanning transmission electron microscopy image simulations of a crystalline nanoparticle on an amorphous carbon substrate. |
| doi_str_mv | 10.1186/s40679-017-0046-1 |
| format | Article |
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f
that has typical values of 4–20 for atomic resolution simulations. We show that in many cases PRISM can provide a speedup that scales with
f
4
compared to multislice simulations, with a negligible loss of accuracy. We demonstrate the usefulness of this method with large-scale scanning transmission electron microscopy image simulations of a crystalline nanoparticle on an amorphous carbon substrate.</description><identifier>ISSN: 2198-0926</identifier><identifier>EISSN: 2198-0926</identifier><identifier>DOI: 10.1186/s40679-017-0046-1</identifier><identifier>PMID: 28546904</identifier><language>eng</language><publisher>Cham: Springer International Publishing</publisher><subject>Algorithms ; Biological Microscopy ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Computer simulation ; electron scattering ; Electrons ; image simulation ; Image transmission ; Materials Science ; MATHEMATICS AND COMPUTING ; Scanning electron microscopy ; Scanning transmission electron microscopy ; Simulation ; Spectroscopy/Spectrometry ; Transmission electron microscopy</subject><ispartof>Advanced structural and chemical imaging, 2017-05, Vol.3 (1), p.13-11, Article 13</ispartof><rights>The Author(s) 2017</rights><rights>Advanced Structural and Chemical Imaging is a copyright of Springer, (2017). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c563t-6febb9d1ca208784f8ca9b72cb22b6804186bbe10c39472e428b324fa21cf90f3</citedby><cites>FETCH-LOGICAL-c563t-6febb9d1ca208784f8ca9b72cb22b6804186bbe10c39472e428b324fa21cf90f3</cites><orcidid>0000-0003-2348-8558 ; 0000000323488558</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1186/s40679-017-0046-1$$EPDF$$P50$$Gspringer$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://doi.org/10.1186/s40679-017-0046-1$$EHTML$$P50$$Gspringer$$Hfree_for_read</linktohtml><link.rule.ids>230,314,780,784,885,27923,27924,41119,42188,51575</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/28546904$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/1356279$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Ophus, Colin</creatorcontrib><creatorcontrib>Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)</creatorcontrib><title>A fast image simulation algorithm for scanning transmission electron microscopy</title><title>Advanced structural and chemical imaging</title><addtitle>Adv Struct Chem Imag</addtitle><addtitle>Adv Struct Chem Imaging</addtitle><description>Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, namely the Bloch wave and multislice methods. PRISM uses a Fourier interpolation factor
f
that has typical values of 4–20 for atomic resolution simulations. We show that in many cases PRISM can provide a speedup that scales with
f
4
compared to multislice simulations, with a negligible loss of accuracy. 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We present a new algorithm named PRISM that combines features of the two most commonly used algorithms, namely the Bloch wave and multislice methods. PRISM uses a Fourier interpolation factor
f
that has typical values of 4–20 for atomic resolution simulations. We show that in many cases PRISM can provide a speedup that scales with
f
4
compared to multislice simulations, with a negligible loss of accuracy. We demonstrate the usefulness of this method with large-scale scanning transmission electron microscopy image simulations of a crystalline nanoparticle on an amorphous carbon substrate.</abstract><cop>Cham</cop><pub>Springer International Publishing</pub><pmid>28546904</pmid><doi>10.1186/s40679-017-0046-1</doi><tpages>11</tpages><orcidid>https://orcid.org/0000-0003-2348-8558</orcidid><orcidid>https://orcid.org/0000000323488558</orcidid><oa>free_for_read</oa></addata></record> |
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| source | Springer Nature OA Free Journals; EZB-FREE-00999 freely available EZB journals |
| subjects | Algorithms Biological Microscopy Characterization and Evaluation of Materials Chemistry and Materials Science Computer simulation electron scattering Electrons image simulation Image transmission Materials Science MATHEMATICS AND COMPUTING Scanning electron microscopy Scanning transmission electron microscopy Simulation Spectroscopy/Spectrometry Transmission electron microscopy |
| title | A fast image simulation algorithm for scanning transmission electron microscopy |
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