Changing the thickness of two layers: i-ZnO nanorods, p-Cu2O and its influence on the carriers transport mechanism of the p-Cu2O/i-ZnO nanorods/n-IGZO heterojunction
In this study, two layers: i-ZnO nanorods and p-Cu 2 O were fabricated by electrochemical deposition. The fabricating process was the initial formation of ZnO nanorods layer on the n-IGZO thin film which was prepared by sputtering method, then a p-Cu 2 O layer was deposited on top of rods to form th...
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| creator | Ke, Nguyen Huu Trinh, Le Thi Tuyet Phung, Pham Kim Loan, Phan Thi Kieu Tuan, Dao Anh Truong, Nguyen Huu Tran, Cao Vinh Hung, Le Vu Tuan |
| description | In this study, two layers: i-ZnO nanorods and p-Cu
2
O were fabricated by electrochemical deposition. The fabricating process was the initial formation of ZnO nanorods layer on the n-IGZO thin film which was prepared by sputtering method, then a p-Cu
2
O layer was deposited on top of rods to form the p-Cu
2
O/i-ZnO nanorods/n-ZnO heterojunction. The XRD, SEM, UV–VIS, I–V characteristics methods were used to define structure, optical and electrical properties of these heterojunction layers. The fabricating conditions and thickness of the Cu
2
O layers significantly affected to the formation, microstructure, electrical and optical properties of the junction. The length of i-ZnO nanorods layer in the structure of the heterojunction has strongly affected to the carriers transport mechanism and performance of this heterojunction. |
| doi_str_mv | 10.1186/s40064-016-2468-y |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_pubme</sourceid><recordid>TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_4906095</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1801864666</sourcerecordid><originalsourceid>FETCH-LOGICAL-c442t-afbc779ffcb4050d8d23d92ca44712e41b5720228b553a81274424cc76b5a9cd3</originalsourceid><addsrcrecordid>eNp9kcFu1DAQhi0EolXpA3BBPnLArO04dsIBCa2gVKq0F7j0YjmOs-slGS-2A9oH4j3xNqVqL1iyPNL8_zcj_wi9ZvQ9Y41cJUGpFIQySbiQDTk-Q-ectRVhDWXPH9Vn6DKlPS1HKiYUfYnOuKpU3ar2HP1Z7wxsPWxx3rlyvf0BLiUcBpx_Bzyao4vpA_bkFjYYDIQY-vQOH8h65htsoMc-J-xhGGcH1uEAdyBrYvTFiXM0kA4hZjw5W0b5NN2xi2ZhrJ6iV0Cur243eOeyi2E_g80-wCv0YjBjcpf37wX6_uXzt_VXcrO5ul5_uiFWCJ6JGTqrVDsMthO0pn3T86pvuTVCKMadYF2tOOW86eq6Mg3jqtiEtUp2tWltX12gjwv3MHeT662Dsv-oD9FPJh51MF4_7YDf6W34pUVLJW3rAnh7D4jh5-xS1pNP1o2jARfmpE95NFJIKYuULVIbQ0rRDQ9jGNWnhPWSsC4J61PC-lg8bx7v9-D4l2cR8EWQSgu2Lup9mCOUP_sP9S8dl7Q3</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1801864666</pqid></control><display><type>article</type><title>Changing the thickness of two layers: i-ZnO nanorods, p-Cu2O and its influence on the carriers transport mechanism of the p-Cu2O/i-ZnO nanorods/n-IGZO heterojunction</title><source>PubMed Central Open Access</source><source>Springer Nature OA Free Journals</source><source>EZB-FREE-00999 freely available EZB journals</source><source>PubMed Central</source><source>Free Full-Text Journals in Chemistry</source><creator>Ke, Nguyen Huu ; Trinh, Le Thi Tuyet ; Phung, Pham Kim ; Loan, Phan Thi Kieu ; Tuan, Dao Anh ; Truong, Nguyen Huu ; Tran, Cao Vinh ; Hung, Le Vu Tuan</creator><creatorcontrib>Ke, Nguyen Huu ; Trinh, Le Thi Tuyet ; Phung, Pham Kim ; Loan, Phan Thi Kieu ; Tuan, Dao Anh ; Truong, Nguyen Huu ; Tran, Cao Vinh ; Hung, Le Vu Tuan</creatorcontrib><description>In this study, two layers: i-ZnO nanorods and p-Cu
2
O were fabricated by electrochemical deposition. The fabricating process was the initial formation of ZnO nanorods layer on the n-IGZO thin film which was prepared by sputtering method, then a p-Cu
2
O layer was deposited on top of rods to form the p-Cu
2
O/i-ZnO nanorods/n-ZnO heterojunction. The XRD, SEM, UV–VIS, I–V characteristics methods were used to define structure, optical and electrical properties of these heterojunction layers. The fabricating conditions and thickness of the Cu
2
O layers significantly affected to the formation, microstructure, electrical and optical properties of the junction. The length of i-ZnO nanorods layer in the structure of the heterojunction has strongly affected to the carriers transport mechanism and performance of this heterojunction.</description><identifier>ISSN: 2193-1801</identifier><identifier>EISSN: 2193-1801</identifier><identifier>DOI: 10.1186/s40064-016-2468-y</identifier><identifier>PMID: 27375979</identifier><language>eng</language><publisher>Cham: Springer International Publishing</publisher><subject>Advancing Global Surgery ; Humanities and Social Sciences ; multidisciplinary ; Physics and Astronomy ; Science ; Science (multidisciplinary)</subject><ispartof>SpringerPlus, 2016-06, Vol.5 (1), p.710-710, Article 710</ispartof><rights>The Author(s) 2016</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c442t-afbc779ffcb4050d8d23d92ca44712e41b5720228b553a81274424cc76b5a9cd3</citedby><cites>FETCH-LOGICAL-c442t-afbc779ffcb4050d8d23d92ca44712e41b5720228b553a81274424cc76b5a9cd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.ncbi.nlm.nih.gov/pmc/articles/PMC4906095/pdf/$$EPDF$$P50$$Gpubmedcentral$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://www.ncbi.nlm.nih.gov/pmc/articles/PMC4906095/$$EHTML$$P50$$Gpubmedcentral$$Hfree_for_read</linktohtml><link.rule.ids>230,314,727,780,784,885,27924,27925,41120,42189,51576,53791,53793</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/27375979$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Ke, Nguyen Huu</creatorcontrib><creatorcontrib>Trinh, Le Thi Tuyet</creatorcontrib><creatorcontrib>Phung, Pham Kim</creatorcontrib><creatorcontrib>Loan, Phan Thi Kieu</creatorcontrib><creatorcontrib>Tuan, Dao Anh</creatorcontrib><creatorcontrib>Truong, Nguyen Huu</creatorcontrib><creatorcontrib>Tran, Cao Vinh</creatorcontrib><creatorcontrib>Hung, Le Vu Tuan</creatorcontrib><title>Changing the thickness of two layers: i-ZnO nanorods, p-Cu2O and its influence on the carriers transport mechanism of the p-Cu2O/i-ZnO nanorods/n-IGZO heterojunction</title><title>SpringerPlus</title><addtitle>SpringerPlus</addtitle><addtitle>Springerplus</addtitle><description>In this study, two layers: i-ZnO nanorods and p-Cu
2
O were fabricated by electrochemical deposition. The fabricating process was the initial formation of ZnO nanorods layer on the n-IGZO thin film which was prepared by sputtering method, then a p-Cu
2
O layer was deposited on top of rods to form the p-Cu
2
O/i-ZnO nanorods/n-ZnO heterojunction. The XRD, SEM, UV–VIS, I–V characteristics methods were used to define structure, optical and electrical properties of these heterojunction layers. The fabricating conditions and thickness of the Cu
2
O layers significantly affected to the formation, microstructure, electrical and optical properties of the junction. The length of i-ZnO nanorods layer in the structure of the heterojunction has strongly affected to the carriers transport mechanism and performance of this heterojunction.</description><subject>Advancing Global Surgery</subject><subject>Humanities and Social Sciences</subject><subject>multidisciplinary</subject><subject>Physics and Astronomy</subject><subject>Science</subject><subject>Science (multidisciplinary)</subject><issn>2193-1801</issn><issn>2193-1801</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>C6C</sourceid><recordid>eNp9kcFu1DAQhi0EolXpA3BBPnLArO04dsIBCa2gVKq0F7j0YjmOs-slGS-2A9oH4j3xNqVqL1iyPNL8_zcj_wi9ZvQ9Y41cJUGpFIQySbiQDTk-Q-ectRVhDWXPH9Vn6DKlPS1HKiYUfYnOuKpU3ar2HP1Z7wxsPWxx3rlyvf0BLiUcBpx_Bzyao4vpA_bkFjYYDIQY-vQOH8h65htsoMc-J-xhGGcH1uEAdyBrYvTFiXM0kA4hZjw5W0b5NN2xi2ZhrJ6iV0Cur243eOeyi2E_g80-wCv0YjBjcpf37wX6_uXzt_VXcrO5ul5_uiFWCJ6JGTqrVDsMthO0pn3T86pvuTVCKMadYF2tOOW86eq6Mg3jqtiEtUp2tWltX12gjwv3MHeT662Dsv-oD9FPJh51MF4_7YDf6W34pUVLJW3rAnh7D4jh5-xS1pNP1o2jARfmpE95NFJIKYuULVIbQ0rRDQ9jGNWnhPWSsC4J61PC-lg8bx7v9-D4l2cR8EWQSgu2Lup9mCOUP_sP9S8dl7Q3</recordid><startdate>20160613</startdate><enddate>20160613</enddate><creator>Ke, Nguyen Huu</creator><creator>Trinh, Le Thi Tuyet</creator><creator>Phung, Pham Kim</creator><creator>Loan, Phan Thi Kieu</creator><creator>Tuan, Dao Anh</creator><creator>Truong, Nguyen Huu</creator><creator>Tran, Cao Vinh</creator><creator>Hung, Le Vu Tuan</creator><general>Springer International Publishing</general><scope>C6C</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>5PM</scope></search><sort><creationdate>20160613</creationdate><title>Changing the thickness of two layers: i-ZnO nanorods, p-Cu2O and its influence on the carriers transport mechanism of the p-Cu2O/i-ZnO nanorods/n-IGZO heterojunction</title><author>Ke, Nguyen Huu ; Trinh, Le Thi Tuyet ; Phung, Pham Kim ; Loan, Phan Thi Kieu ; Tuan, Dao Anh ; Truong, Nguyen Huu ; Tran, Cao Vinh ; Hung, Le Vu Tuan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c442t-afbc779ffcb4050d8d23d92ca44712e41b5720228b553a81274424cc76b5a9cd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Advancing Global Surgery</topic><topic>Humanities and Social Sciences</topic><topic>multidisciplinary</topic><topic>Physics and Astronomy</topic><topic>Science</topic><topic>Science (multidisciplinary)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ke, Nguyen Huu</creatorcontrib><creatorcontrib>Trinh, Le Thi Tuyet</creatorcontrib><creatorcontrib>Phung, Pham Kim</creatorcontrib><creatorcontrib>Loan, Phan Thi Kieu</creatorcontrib><creatorcontrib>Tuan, Dao Anh</creatorcontrib><creatorcontrib>Truong, Nguyen Huu</creatorcontrib><creatorcontrib>Tran, Cao Vinh</creatorcontrib><creatorcontrib>Hung, Le Vu Tuan</creatorcontrib><collection>Springer Nature OA Free Journals</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>SpringerPlus</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ke, Nguyen Huu</au><au>Trinh, Le Thi Tuyet</au><au>Phung, Pham Kim</au><au>Loan, Phan Thi Kieu</au><au>Tuan, Dao Anh</au><au>Truong, Nguyen Huu</au><au>Tran, Cao Vinh</au><au>Hung, Le Vu Tuan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Changing the thickness of two layers: i-ZnO nanorods, p-Cu2O and its influence on the carriers transport mechanism of the p-Cu2O/i-ZnO nanorods/n-IGZO heterojunction</atitle><jtitle>SpringerPlus</jtitle><stitle>SpringerPlus</stitle><addtitle>Springerplus</addtitle><date>2016-06-13</date><risdate>2016</risdate><volume>5</volume><issue>1</issue><spage>710</spage><epage>710</epage><pages>710-710</pages><artnum>710</artnum><issn>2193-1801</issn><eissn>2193-1801</eissn><abstract>In this study, two layers: i-ZnO nanorods and p-Cu
2
O were fabricated by electrochemical deposition. The fabricating process was the initial formation of ZnO nanorods layer on the n-IGZO thin film which was prepared by sputtering method, then a p-Cu
2
O layer was deposited on top of rods to form the p-Cu
2
O/i-ZnO nanorods/n-ZnO heterojunction. The XRD, SEM, UV–VIS, I–V characteristics methods were used to define structure, optical and electrical properties of these heterojunction layers. The fabricating conditions and thickness of the Cu
2
O layers significantly affected to the formation, microstructure, electrical and optical properties of the junction. The length of i-ZnO nanorods layer in the structure of the heterojunction has strongly affected to the carriers transport mechanism and performance of this heterojunction.</abstract><cop>Cham</cop><pub>Springer International Publishing</pub><pmid>27375979</pmid><doi>10.1186/s40064-016-2468-y</doi><tpages>1</tpages><oa>free_for_read</oa></addata></record> |
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| subjects | Advancing Global Surgery Humanities and Social Sciences multidisciplinary Physics and Astronomy Science Science (multidisciplinary) |
| title | Changing the thickness of two layers: i-ZnO nanorods, p-Cu2O and its influence on the carriers transport mechanism of the p-Cu2O/i-ZnO nanorods/n-IGZO heterojunction |
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