The neural basis of trait self-esteem revealed by the amplitude of low-frequency fluctuations and resting state functional connectivity
Self-esteem is an affective, self-evaluation of oneself and has a significant effect on mental and behavioral health. Although research has focused on the neural substrates of self-esteem, little is known about the spontaneous brain activity that is associated with trait self-esteem (TSE) during the...
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Veröffentlicht in: | Social cognitive and affective neuroscience 2016-03, Vol.11 (3), p.367-376 |
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Sprache: | eng |
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Zusammenfassung: | Self-esteem is an affective, self-evaluation of oneself and has a significant effect on mental and behavioral health. Although research has focused on the neural substrates of self-esteem, little is known about the spontaneous brain activity that is associated with trait self-esteem (TSE) during the resting state. In this study, we used the resting-state functional magnetic resonance imaging (fMRI) signal of the amplitude of low-frequency fluctuations (ALFFs) and resting state functional connectivity (RSFC) to identify TSE-related regions and networks. We found that a higher level of TSE was associated with higher ALFFs in the left ventral medial prefrontal cortex (vmPFC) and lower ALFFs in the left cuneus/lingual gyrus and right lingual gyrus. RSFC analyses revealed that the strengths of functional connectivity between the left vmPFC and bilateral hippocampus were positively correlated with TSE; however, the connections between the left vmPFC and right inferior frontal gyrus and posterior superior temporal sulcus were negatively associated with TSE. Furthermore, the strengths of functional connectivity between the left cuneus/lingual gyrus and right dorsolateral prefrontal cortex and anterior cingulate cortex were positively related to TSE. These findings indicate that TSE is linked to core regions in the default mode network and social cognition network, which is involved in self-referential processing, autobiographical memory and social cognition. |
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ISSN: | 1749-5016 1749-5024 |
DOI: | 10.1093/scan/nsv119 |