Nanoscale imaging of buried topological defects with quantitative X-ray magnetic microscopy

Advances in nanoscale magnetism increasingly require characterization tools providing detailed descriptions of magnetic configurations. Magnetic transmission X-ray microscopy produces element specific magnetic domain images with nanometric lateral resolution in films up to ∼100 nm thick. Here we present an imaging method using the angular dependence of magnetic contrast in a series of high resolution transmission X-ray microscopy images to obtain quantitative descriptions of the magnetization (canting angles relative to surface normal and sense). This method is applied to 55–120 nm thick ferromagnetic NdCo 5 layers (canting angles between 65° and 22°), and to a NdCo 5 film covered with permalloy. Interestingly, permalloy induces a 43° rotation of Co magnetization towards surface normal. Our method allows identifying complex topological defects (merons or ½ skyrmions) in a NdCo 5 film that are only partially replicated by the permalloy overlayer. These results open possibilities for the characterization of deeply buried magnetic topological defects, nanostructures and devices. Transmission X-ray microscopy allows for the imaging of magnetic domains in thin film materials. Here, the authors exploit the angular dependence of the magnetic contrast to extract out-of-plane canting angles of stripe domains and topological defects in NdCo 5 films buried under a NiFe layer.