Enhanced electrical properties in sub-10-nm WO3 nanoflakes prepared via a two-step sol-gel-exfoliation method

The morphology and electrical properties of orthorhombic β-WO 3 nanoflakes with thickness of ~7 to 9 nm were investigated at the nanoscale with a combination of scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), current sensing force spectroscopy atomic force microscopy...

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Veröffentlicht in:Nanoscale research letters 2014-08, Vol.9 (1), p.401-401, Article 401
Hauptverfasser: Zhuiykov, Serge, Kats, Eugene
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Sprache:eng
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Zusammenfassung:The morphology and electrical properties of orthorhombic β-WO 3 nanoflakes with thickness of ~7 to 9 nm were investigated at the nanoscale with a combination of scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), current sensing force spectroscopy atomic force microscopy (CSFS-AFM, or PeakForce TUNA™), Fourier transform infra-red absorption spectroscopy (FTIR), linear sweep voltammetry (LSV) and Raman spectroscopy techniques. CSFS-AFM analysis established good correlation between the topography of the developed nanostructures and various features of WO 3 nanoflakes synthesized via a two-step sol-gel-exfoliation method. It was determined that β-WO 3 nanoflakes annealed at 550°C possess distinguished and exceptional thickness-dependent properties in comparison with the bulk, micro and nanostructured WO 3 synthesized at alternative temperatures.
ISSN:1931-7573
1556-276X
1556-276X
DOI:10.1186/1556-276X-9-401