Glancing angle Talbot-Lau grating interferometers for phase contrast imaging at high x-ray energy

A Talbot-Lau interferometer is demonstrated using micro-periodic gratings inclined at a glancing angle along the light propagation direction. Due to the increase in the effective thickness of the absorption gratings, the device enables differential phase contrast imaging at high x-ray energy, with i...

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Veröffentlicht in:Applied physics letters 2012-08, Vol.101 (9), p.91108-91108
Hauptverfasser: Stutman, D, Finkenthal, M
Format: Artikel
Sprache:eng
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Zusammenfassung:A Talbot-Lau interferometer is demonstrated using micro-periodic gratings inclined at a glancing angle along the light propagation direction. Due to the increase in the effective thickness of the absorption gratings, the device enables differential phase contrast imaging at high x-ray energy, with improved fringe visibility (contrast). For instance, at 28° glancing angle, we obtain up to ∼35% overall interferometer contrast with a spectrum having ∼43 keV mean energy, suitable for medical applications. In addition, glancing angle interferometers could provide high contrast at energies above 100 keV, enabling industrial and security applications of phase contrast imaging.
ISSN:0003-6951
1077-3118
0003-6951
DOI:10.1063/1.4748882