Strong fragmentation processes driven by low energy electron attachment to various small perfluoroether molecules

Strong fragmentation processes driven by low energy electron attachment to various small perfluoroether molecules

[Display omitted] ► Studied perfluoroether are sensitive towards subexcitation electrons. ► Fragment anions are formed by loss of neutral CF2, CF3 and CF2OCF3 units. ► Electrons contribute to degradation of perfluoropolyether films on hard discs. Negative ion formation in the three perfluoroethers (...

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Veröffentlicht in:International journal of mass spectrometry 2011-09, Vol.306 (1), p.63-69
Hauptverfasser: Mitterdorfer, C., Edtbauer, A., Karolczak, S., Postler, J., Gschliesser, D., Denifl, S., Illenberger, E., Scheier, P.
Format: Artikel
Sprache:eng
Schlagworte:
Anion efficiency curves
Dissociative electron attachment
Negative ion mass spectra
Perfluoroethers
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Zusammenfassung:[Display omitted] ► Studied perfluoroether are sensitive towards subexcitation electrons. ► Fragment anions are formed by loss of neutral CF2, CF3 and CF2OCF3 units. ► Electrons contribute to degradation of perfluoropolyether films on hard discs. Negative ion formation in the three perfluoroethers (PFEs) diglyme (C6F14O3), triglyme (C8F18O4) and crownether (C10F20O5) is studied following electron attachment in the range from ∼0 to 15eV. All three compounds show intense low energy resonances at subexcitation energies (
ISSN:1387-3806
1873-2798
DOI:10.1016/j.ijms.2011.06.018