Localized heating on silicon field effect transistors: device fabrication and temperature measurements in fluid

We demonstrate electrically addressable localized heating in fluid at the dielectric surface of silicon-on-insulator field-effect transistors via radio-frequency Joule heating of mobile ions in the Debye layer. Measurement of fluid temperatures in close vicinity to surfaces poses a challenge due to...

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Veröffentlicht in:Lab on a chip 2009-01, Vol.9 (19), p.2789-2795
Hauptverfasser: Elibol, Oguz H, Reddy, Jr, Bobby, Nair, Pradeep R, Dorvel, Brian, Butler, Felice, Ahsan, Zahab S, Bergstrom, Donald E, Alam, Muhammad A, Bashir, Rashid
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Sprache:eng
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Zusammenfassung:We demonstrate electrically addressable localized heating in fluid at the dielectric surface of silicon-on-insulator field-effect transistors via radio-frequency Joule heating of mobile ions in the Debye layer. Measurement of fluid temperatures in close vicinity to surfaces poses a challenge due to the localized nature of the temperature profile. To address this, we developed a localized thermometry technique based on the fluorescence decay rate of covalently attached fluorophores to extract the temperature within 2 nm of any oxide surface. We demonstrate precise spatial control of voltage dependent temperature profiles on the transistor surfaces. Our results introduce a new dimension to present sensing systems by enabling dual purpose silicon transistor-heaters that serve both as field effect sensors as well as temperature controllers that could perform localized bio-chemical reactions in Lab on Chip applications.
ISSN:1473-0197
1473-0189
DOI:10.1039/b906048k