Reaching the potential of electron diffraction

Microcrystal electron diffraction (MicroED) is an emerging structural technique in which submicron crystals are used to generate diffraction data for structural studies. Structures allow for the study of molecular-level architecture and drive hypotheses about modes of action, mechanisms, dynamics, a...

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Veröffentlicht in:Cell reports physical science 2024-06, Vol.5 (6), p.102007, Article 102007
Hauptverfasser: Acehan, Devrim, Spoth, Katherine A., Budziszewski, Gabrielle R., Snell, M. Elizabeth, Campomizzi, Christopher S., Lynch, Miranda L., Bowman, Sarah E.J.
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Sprache:eng
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Zusammenfassung:Microcrystal electron diffraction (MicroED) is an emerging structural technique in which submicron crystals are used to generate diffraction data for structural studies. Structures allow for the study of molecular-level architecture and drive hypotheses about modes of action, mechanisms, dynamics, and interactions with other molecules. Combining cryoelectron microscopy (cryo-EM) instrumentation with crystallographic techniques, MicroED has led to three-dimensional structural models of small molecules, peptides, and proteins and has generated tremendous interest due to its ability to use vanishingly small crystals. In this perspective, we describe the current state of the field for MicroED methodologies, including making and detecting crystals of the appropriate size for the technique, as well as ways to best handle and characterize these crystals. Our perspective provides insight into ways to unlock the full range of potential for MicroED to access previously intractable samples and describes areas of future development. [Display omitted] Microcrystal electron diffraction is an expanding diffraction-based method making headway in both small-molecule and macromolecular structural science. Here, Acehan et al. discuss the method, provide an overview of current approaches and tools for implementation, and describe challenges and the need for developments going forward.
ISSN:2666-3864
2666-3864
DOI:10.1016/j.xcrp.2024.102007