High-fidelity spin qubit operation and algorithmic initialization above 1 K
The encoding of qubits in semiconductor spin carriers has been recognized as a promising approach to a commercial quantum computer that can be lithographically produced and integrated at scale 1 – 10 . However, the operation of the large number of qubits required for advantageous quantum application...
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Veröffentlicht in: | Nature (London) 2024-03, Vol.627 (8005), p.772-777 |
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Hauptverfasser: | , , , , , , , , , , , , , , , , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The encoding of qubits in semiconductor spin carriers has been recognized as a promising approach to a commercial quantum computer that can be lithographically produced and integrated at scale
1
–
10
. However, the operation of the large number of qubits required for advantageous quantum applications
11
–
13
will produce a thermal load exceeding the available cooling power of cryostats at millikelvin temperatures. As the scale-up accelerates, it becomes imperative to establish fault-tolerant operation above 1 K, at which the cooling power is orders of magnitude higher
14
–
18
. Here we tune up and operate spin qubits in silicon above 1 K, with fidelities in the range required for fault-tolerant operations at these temperatures
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–
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. We design an algorithmic initialization protocol to prepare a pure two-qubit state even when the thermal energy is substantially above the qubit energies and incorporate radiofrequency readout to achieve fidelities up to 99.34% for both readout and initialization. We also demonstrate single-qubit Clifford gate fidelities up to 99.85% and a two-qubit gate fidelity of 98.92%. These advances overcome the fundamental limitation that the thermal energy must be well below the qubit energies for the high-fidelity operation to be possible, surmounting a main obstacle in the pathway to scalable and fault-tolerant quantum computation.
Initialization and operation of spin qubits in silicon above 1 K reach fidelities sufficient for fault-tolerant operations at these temperatures. |
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ISSN: | 0028-0836 1476-4687 1476-4687 |
DOI: | 10.1038/s41586-024-07160-2 |