Advanced exploitation of unmerged reflection data during processing and refinement with autoPROC and BUSTER

The validation of structural models obtained by macromolecular X-ray crystallography against experimental diffraction data, whether before deposition into the PDB or after, is typically carried out exclusively against the merged data that are eventually archived along with the atomic coordinates. It...

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Veröffentlicht in:Acta crystallographica. Section D, Biological crystallography. Biological crystallography., 2024-03, Vol.80 (Pt 3), p.148-158
Hauptverfasser: Vonrhein, Clemens, Flensburg, Claus, Keller, Peter, Fogh, Rasmus, Sharff, Andrew, Tickle, Ian J, Bricogne, Gérard
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Sprache:eng
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Zusammenfassung:The validation of structural models obtained by macromolecular X-ray crystallography against experimental diffraction data, whether before deposition into the PDB or after, is typically carried out exclusively against the merged data that are eventually archived along with the atomic coordinates. It is shown here that the availability of unmerged reflection data enables valuable additional analyses to be performed that yield improvements in the final models, and tools are presented to implement them, together with examples of the results to which they give access. The first example is the automatic identification and removal of image ranges affected by loss of crystal centering or by excessive decay of the diffraction pattern as a result of radiation damage. The second example is the `reflection-auditing' process, whereby individual merged data items showing especially poor agreement with model predictions during refinement are investigated thanks to the specific metadata (such as image number and detector position) that are available for the corresponding unmerged data, potentially revealing previously undiagnosed instrumental, experimental or processing problems. The third example is the calculation of so-called F(early) - F(late) maps from carefully selected subsets of unmerged amplitude data, which can not only highlight the location and extent of radiation damage but can also provide guidance towards suitable fine-grained parametrizations to model the localized effects of such damage.
ISSN:2059-7983
0907-4449
2059-7983
1399-0047
DOI:10.1107/S2059798324001487