Robust ferromagnetism in wafer-scale Fe 3 GaTe 2 above room-temperature

The discovery of ferromagnetism in van der Waals (vdW) materials has enriched the understanding of two-dimensional (2D) magnetic orders and opened new avenues for fundamental physics research and next generation spintronics. However, achieving ferromagnetic order at room temperature, along with stro...

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Veröffentlicht in:Nature communications 2024-12, Vol.15 (1), p.10765
Hauptverfasser: Wu, Shuxiang, He, Zhihao, Gu, Minghui, Ren, Lizhu, Li, Jibin, Deng, Bo, Wang, Di, Guo, Xinhao, Li, Wanjiong, Chen, Mingyi, Chen, Yijun, Meng, Meng, Ye, Quanlin, Shen, Bing, Chen, Xinman, Guo, Jiandong, Xing, Guozhong, Sou, Iam Keong, Li, Shuwei
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Sprache:eng
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Zusammenfassung:The discovery of ferromagnetism in van der Waals (vdW) materials has enriched the understanding of two-dimensional (2D) magnetic orders and opened new avenues for fundamental physics research and next generation spintronics. However, achieving ferromagnetic order at room temperature, along with strong perpendicular magnetic anisotropy, remains a significant challenge. In this work, we report wafer-scale growth of vdW ferromagnet Fe GaTe using molecular beam epitaxy. The epitaxial Fe GaTe films exhibit robust ferromagnetism, exemplified by high Curie temperature (T  = 420 K) and large perpendicular magnetic anisotropy (PMA) constant K  = 6.7 × 10 J/m at 300 K for nine-unit-cell film. Notably, the ferromagnetic order is preserved even in the one-unit-cell film with T reaching 345 K, benefiting from the strong PMA (K  = 1.8×10 J/m at 300 K). In comparison to exfoliated Fe GaTe flakes, our epitaxial films with the same thickness show the significant enhancement of T , which could be ascribed to the tensile strain effect from the substrate. The successful realization of wafer-scale ferromagnetic Fe GaTe films with T far above room temperature represents a substantial advancement (in some aspects or some fields, e.g. material science), paving the way for the development of 2D magnet-based spintronic devices.
ISSN:2041-1723