Infrared crystallography for framework and linker orientation in metal-organic framework films

Pore alignment and linker orientation influence diffusion and guest molecule interactions in metal-organic frameworks (MOFs) and play a pivotal role for successful utilization of MOFs. The crystallographic orientation and the degree of orientation of MOF films are generally determined using X-ray diffraction. However, diffraction methods reach their limit when it comes to very thin films, identification of chemical connectivity or the orientation of organic functional groups in MOFs. Cu-based 2D MOF and 3D MOF films prepared via layer-by-layer method and from aligned Cu(OH) 2 substrates were studied with polarization-dependent Fourier-transform infrared (FTIR) spectroscopy in transmission and attenuated total reflection configuration. Thereby, the degrees for in-plane and out-of-plane orientation, the aromatic linker orientation and the initial alignment during layer-by-layer MOF growth, which is impossible to investigate by laboratory XRD equipment, was determined. Experimental IR spectra correlate with theoretical explanations, paving the way to expand the principle of IR crystallography to oriented, organic-inorganic hybrid films beyond MOFs. Polarization-dependent infrared spectroscopy of oriented metal organic framework films fills the information gap left by diffraction methods and gives access to the orientation of the aromatic linker and initial orientation of ultra-thin films.