Labeling interacting configurations through an analysis of excitation dynamics in a resonant photoemission experiment: the case of rutile TiO2

A detailed study of resonant photoemission at Ti L2,3 edges of insulating rutile TiO2−x thin film is presented. Pure TiO2 resonating structures, defect-related resonances, resonant Raman-Auger and normal LVV Auger emissions are tracked, including an unpredicted two-hole correlated satellite below th...

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Veröffentlicht in:Journal of physics. Condensed matter 2013-02, Vol.25 (7), p.075502-075502
Hauptverfasser: Drera, G, Sangaletti, L, Bondino, F, Malvestuto, M, Malavasi, L, Diaz-Fernandez, Y, Dash, S, Mozzati, M C, Galinetto, P
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Sprache:eng
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Zusammenfassung:A detailed study of resonant photoemission at Ti L2,3 edges of insulating rutile TiO2−x thin film is presented. Pure TiO2 resonating structures, defect-related resonances, resonant Raman-Auger and normal LVV Auger emissions are tracked, including an unpredicted two-hole correlated satellite below the non-bonding part of the valence band. The analysis of excitation dynamics unambiguously addresses the origin of these features and, in particular, the extent of charge transfer effects on the Ti-O bonding in the valence band of rutile, disclosing further applications to the more general case of, formally, d0 oxides.
ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/25/7/075502