Comparing high-frequency control devices

To evaluate the three semiconductor materials, a HEMT device structure was selected as optimum for highfrequency switching and control functions. The resistances and capacitances forming the HEMT equivalent circuit can be subdivided into configurations representing the two switch states (on and off)...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Microwaves & RF 2003-03, Vol.42 (3), p.53-60
Hauptverfasser: KAMECHE, Mohamed, BEKHTI, Mohammed
Format: Magazinearticle
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:To evaluate the three semiconductor materials, a HEMT device structure was selected as optimum for highfrequency switching and control functions. The resistances and capacitances forming the HEMT equivalent circuit can be subdivided into configurations representing the two switch states (on and off). For most control applications, at frequencies of most interest, the on-- state impedance is mostly resistive while the off-state impedance is mostly capacitive.
ISSN:0745-2993
2162-1411