Optical interconnect needs new metrology

Optical interconnect needs new metrology

Nanostructures need metrology that can extract the electronic properties of these nanophysical building blocks, including quantum wells, quantum wires and quantum dots. Note that nanostructure electronic signatures are always present at optical wavelengths, since semiconductor electronic transitions...

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Veröffentlicht in:Electronic Engineering Times 2004-02 (1308), p.45
1. Verfasser: Chism, William
Format: Artikel
Sprache:eng
Schlagworte:
Electronics industry
Fiber optic communications
Fourier transforms
Interconnect
Manufacturing
Nanotechnology
Quantum dots
Spectrum analysis
Technological change
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Beschreibung
Zusammenfassung:Nanostructures need metrology that can extract the electronic properties of these nanophysical building blocks, including quantum wells, quantum wires and quantum dots. Note that nanostructure electronic signatures are always present at optical wavelengths, since semiconductor electronic transitions occur in the 1- to 3-eV range.
ISSN:0192-1541