Scan-based transition-fault test can do job

Scan-based transition-fault test can do job

The launch-from-shift technique results in improved test coverage with a fewer number of patterns, in most cases. The main reason is that the launch-from-capture technique is based on a sequential automatic test pattern generation (ATPG) algorithm, while the launch-from-shift method uses a combinati...

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Veröffentlicht in:Electronic Engineering Times 2003-10 (1293), p.60
Hauptverfasser: Jayaram, Vinay B, Saxena, Jayashree, Butler, Kenneth M
Format: Artikel
Sprache:eng
Schlagworte:
Design
Information storage
Integrated circuits
Manufacturing
Quality control
Scanning
Test methods
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Beschreibung
Zusammenfassung:The launch-from-shift technique results in improved test coverage with a fewer number of patterns, in most cases. The main reason is that the launch-from-capture technique is based on a sequential automatic test pattern generation (ATPG) algorithm, while the launch-from-shift method uses a combination-al ATPG algorithm. Commercial pattern generation and compression tools are more efficient in a combinational ATPG environment.
ISSN:0192-1541