Dislocations in Bi₀.₄Ca₀.₆MnO₃ epitaxial film grown on (110) SrTiO₃ substrate

Bi₀.₄Ca₀.₆MnO₃ (BCMO) film with a thickness of 110nm was epitaxially grown on a (110) SrTiO₃ (STO) substrate using pulsed laser ablation technique. The microstructure of the epitaxial films was investigated by transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) in details. Two different kinds of dislocations, one being perpendicular to the BCMO/STO interface, the other being parallel to the interface, have been commonly observed. The formation mechanism for these dislocations has been discussed. All the dislocations are thought to relieve the local strain in the epitaxial film.