Improvement of the short-circuit current density and efficiency in micromorph tandem solar cells by an anti-reflection layer

An anti-reflection layer has been fabricated and applied in micromorph tandem (a-Si:H/μc-Si:H) solar cells. In this work, the porous anti-reflection layers are produced on glass substrates by plasma enhanced chemical vapor deposition using a CF 4 and O 2 gas mixture. The process is simple and easily...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Thin solid films 2011-10, Vol.520 (1), p.550-553
Hauptverfasser: Chang, Ping-Kuan, Hsieh, Po-Tsung, Tsai, Fu-Ji, Lu, Chun-Hsiung, Yeh, Chih-Hung, Houng, Mau-Phon
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:An anti-reflection layer has been fabricated and applied in micromorph tandem (a-Si:H/μc-Si:H) solar cells. In this work, the porous anti-reflection layers are produced on glass substrates by plasma enhanced chemical vapor deposition using a CF 4 and O 2 gas mixture. The process is simple and easily controlled. The tandem solar cells with the anti-reflection layer show the increased short-circuit current density of the solar cells due to increased light transmittance from air/glass interface. With the anti-reflection layer, the short-circuit current density of the tandem cell increases by 0.29 mA/cm 2. Meanwhile, the solar cell efficiency increases from 11.15% to 11.55% (3.5% in relative) which allows us to develop more efficient a-Si based solar cells.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2011.06.086