Improvement of the short-circuit current density and efficiency in micromorph tandem solar cells by an anti-reflection layer
An anti-reflection layer has been fabricated and applied in micromorph tandem (a-Si:H/μc-Si:H) solar cells. In this work, the porous anti-reflection layers are produced on glass substrates by plasma enhanced chemical vapor deposition using a CF 4 and O 2 gas mixture. The process is simple and easily...
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Veröffentlicht in: | Thin solid films 2011-10, Vol.520 (1), p.550-553 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | An anti-reflection layer has been fabricated and applied in micromorph tandem (a-Si:H/μc-Si:H) solar cells. In this work, the porous anti-reflection layers are produced on glass substrates by plasma enhanced chemical vapor deposition using a CF
4 and O
2 gas mixture. The process is simple and easily controlled. The tandem solar cells with the anti-reflection layer show the increased short-circuit current density of the solar cells due to increased light transmittance from air/glass interface. With the anti-reflection layer, the short-circuit current density of the tandem cell increases by 0.29
mA/cm
2. Meanwhile, the solar cell efficiency increases from 11.15% to 11.55% (3.5% in relative) which allows us to develop more efficient a-Si based solar cells. |
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ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/j.tsf.2011.06.086 |