Atomic Force Microscopy in Viscous Ionic Liquids

Extracting quantitative information from amplitude-modulation atomic force microscopy (AM-AFM) in viscous ionic liquids is difficult because existing theory requires knowledge of the cantilever natural frequency, which cannot be measured in the absence of a resonance peak. We present a new model tha...

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Veröffentlicht in:Langmuir 2012-03, Vol.28 (12), p.5319-5322
Hauptverfasser: Labuda, Aleksander, Grütter, Peter
Format: Artikel
Sprache:eng
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Zusammenfassung:Extracting quantitative information from amplitude-modulation atomic force microscopy (AM-AFM) in viscous ionic liquids is difficult because existing theory requires knowledge of the cantilever natural frequency, which cannot be measured in the absence of a resonance peak. We present a new model that describes cantilever dynamics in an overdamped medium (Q < 0.5) and derive the theory necessary to extract the stiffness and damping in highly viscous liquids. The proposed methodology is used to measure the solvation layers of an ionic liquid at a gold electrode.
ISSN:0743-7463
1520-5827
DOI:10.1021/la300557u