Photoelectrochemical characterization of the synthetic crednerite CuMnO2
High quality crednerite CuMnO 2 was prepared by solid state reaction at 950 °C under argon flow. The oxide crystallizes in a monoclinically distorted delafossite structure associated to the static Jahn–Teller (J–T) effect of Mn 3+ ion. Thermal analysis showed that it converts reversibly to spinel Cu...
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creator | Bellal, B. Hadjarab, B. Benreguia, N. Bessekhouad, Y. Trari, M. |
description | High quality crednerite CuMnO
2
was prepared by solid state reaction at 950 °C under argon flow. The oxide crystallizes in a monoclinically distorted delafossite structure associated to the static Jahn–Teller (J–T) effect of Mn
3+
ion. Thermal analysis showed that it converts reversibly to spinel Cu
x
Mn
3−
x
O
4
at ~420 °C in air and further heating reform the crednerite above 940 °C. CuMnO
2
is
p
-type, narrow semiconductor band gap with a direct optical gap of 1.31 eV. It exhibits a long-term chemical stability in basic medium (KOH 0.5 M), the semi logarithmic plot gave an exchange current density of 0.2 μA cm
−2
and a corrosion potential of ~−0.1 V
SCE
. The electrochemical oxygen insertion/desinsertion is evidenced from the intensity–potential characteristics. The flat band potential (
V
fb
= −0.26 V
SCE
) and the holes density (
N
A
= 5.12 × 10
18
cm
−3
) were determined, respectively, by extrapolating the curve
C
−
2
versus the potential to the intersection with
C
−
2
= 0 and from the slope of the Mott–Schottky plot. From photoelectrochemical measurements, the valence band formed from Cu-3
d
wave function is positioned at 5.24 ± 0.02 eV below vacuum. The Nyquist representation shows straight line in the high frequency range with an angle of 65° ascribed to Warburg impedance originating from oxygen intercalation and compatible with a system under mass transfer control. The electrochemical junction is modeled by an equivalent electrical circuit thanks to the Randles model. |
doi_str_mv | 10.1007/s10800-011-0307-y |
format | Article |
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2
was prepared by solid state reaction at 950 °C under argon flow. The oxide crystallizes in a monoclinically distorted delafossite structure associated to the static Jahn–Teller (J–T) effect of Mn
3+
ion. Thermal analysis showed that it converts reversibly to spinel Cu
x
Mn
3−
x
O
4
at ~420 °C in air and further heating reform the crednerite above 940 °C. CuMnO
2
is
p
-type, narrow semiconductor band gap with a direct optical gap of 1.31 eV. It exhibits a long-term chemical stability in basic medium (KOH 0.5 M), the semi logarithmic plot gave an exchange current density of 0.2 μA cm
−2
and a corrosion potential of ~−0.1 V
SCE
. The electrochemical oxygen insertion/desinsertion is evidenced from the intensity–potential characteristics. The flat band potential (
V
fb
= −0.26 V
SCE
) and the holes density (
N
A
= 5.12 × 10
18
cm
−3
) were determined, respectively, by extrapolating the curve
C
−
2
versus the potential to the intersection with
C
−
2
= 0 and from the slope of the Mott–Schottky plot. From photoelectrochemical measurements, the valence band formed from Cu-3
d
wave function is positioned at 5.24 ± 0.02 eV below vacuum. The Nyquist representation shows straight line in the high frequency range with an angle of 65° ascribed to Warburg impedance originating from oxygen intercalation and compatible with a system under mass transfer control. The electrochemical junction is modeled by an equivalent electrical circuit thanks to the Randles model.</description><identifier>ISSN: 0021-891X</identifier><identifier>EISSN: 1572-8838</identifier><identifier>DOI: 10.1007/s10800-011-0307-y</identifier><language>eng</language><publisher>Dordrecht: Springer Netherlands</publisher><subject>Chemistry ; Chemistry and Materials Science ; Copper ; Current density ; Electric circuits ; Electrical junctions ; Electrochemistry ; Industrial Chemistry/Chemical Engineering ; Mass transfer ; Original Paper ; P-type semiconductors ; Physical Chemistry ; Semiconductors ; Straight lines</subject><ispartof>Journal of applied electrochemistry, 2011-07, Vol.41 (7), p.867-872</ispartof><rights>Springer Science+Business Media B.V. 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c320t-614ac79a4327606242bf81f6578a6ad905cfcb7ec7d1c3ee356082fbe7fb6f083</citedby><cites>FETCH-LOGICAL-c320t-614ac79a4327606242bf81f6578a6ad905cfcb7ec7d1c3ee356082fbe7fb6f083</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10800-011-0307-y$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10800-011-0307-y$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51297</link.rule.ids></links><search><creatorcontrib>Bellal, B.</creatorcontrib><creatorcontrib>Hadjarab, B.</creatorcontrib><creatorcontrib>Benreguia, N.</creatorcontrib><creatorcontrib>Bessekhouad, Y.</creatorcontrib><creatorcontrib>Trari, M.</creatorcontrib><title>Photoelectrochemical characterization of the synthetic crednerite CuMnO2</title><title>Journal of applied electrochemistry</title><addtitle>J Appl Electrochem</addtitle><description>High quality crednerite CuMnO
2
was prepared by solid state reaction at 950 °C under argon flow. The oxide crystallizes in a monoclinically distorted delafossite structure associated to the static Jahn–Teller (J–T) effect of Mn
3+
ion. Thermal analysis showed that it converts reversibly to spinel Cu
x
Mn
3−
x
O
4
at ~420 °C in air and further heating reform the crednerite above 940 °C. CuMnO
2
is
p
-type, narrow semiconductor band gap with a direct optical gap of 1.31 eV. It exhibits a long-term chemical stability in basic medium (KOH 0.5 M), the semi logarithmic plot gave an exchange current density of 0.2 μA cm
−2
and a corrosion potential of ~−0.1 V
SCE
. The electrochemical oxygen insertion/desinsertion is evidenced from the intensity–potential characteristics. The flat band potential (
V
fb
= −0.26 V
SCE
) and the holes density (
N
A
= 5.12 × 10
18
cm
−3
) were determined, respectively, by extrapolating the curve
C
−
2
versus the potential to the intersection with
C
−
2
= 0 and from the slope of the Mott–Schottky plot. From photoelectrochemical measurements, the valence band formed from Cu-3
d
wave function is positioned at 5.24 ± 0.02 eV below vacuum. The Nyquist representation shows straight line in the high frequency range with an angle of 65° ascribed to Warburg impedance originating from oxygen intercalation and compatible with a system under mass transfer control. The electrochemical junction is modeled by an equivalent electrical circuit thanks to the Randles model.</description><subject>Chemistry</subject><subject>Chemistry and Materials Science</subject><subject>Copper</subject><subject>Current density</subject><subject>Electric circuits</subject><subject>Electrical junctions</subject><subject>Electrochemistry</subject><subject>Industrial Chemistry/Chemical Engineering</subject><subject>Mass transfer</subject><subject>Original Paper</subject><subject>P-type semiconductors</subject><subject>Physical Chemistry</subject><subject>Semiconductors</subject><subject>Straight lines</subject><issn>0021-891X</issn><issn>1572-8838</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp9kD1PwzAURS0EEuXjB7BlYwo824ntjKgCilRUBpDYLMd9JqnSuNjOEH49qcLMdId3z5PuIeSGwh0FkPeRggLIgdIcOMh8PCELWkqWK8XVKVkAMJqrin6ek4sYdwBQMVEsyOqt8cljhzYFbxvct9Z0mW1MMDZhaH9Man2feZelBrM49lOk1mY24Laf7gmz5fDab9gVOXOmi3j9l5fk4-nxfbnK15vnl-XDOrecQcoFLYyVlSk4kwIEK1jtFHWilMoIs62gtM7WEq3cUssReSlAMVejdLVwoPgluZ3_HoL_HjAmvW-jxa4zPfoh6mkW51RRPjXp3LTBxxjQ6UNo9yaMmoI-StOzND1J00dpepwYNjNx6vZfGPTOD6GfBv0D_QImcHC7</recordid><startdate>20110701</startdate><enddate>20110701</enddate><creator>Bellal, B.</creator><creator>Hadjarab, B.</creator><creator>Benreguia, N.</creator><creator>Bessekhouad, Y.</creator><creator>Trari, M.</creator><general>Springer Netherlands</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SE</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20110701</creationdate><title>Photoelectrochemical characterization of the synthetic crednerite CuMnO2</title><author>Bellal, B. ; Hadjarab, B. ; Benreguia, N. ; Bessekhouad, Y. ; Trari, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c320t-614ac79a4327606242bf81f6578a6ad905cfcb7ec7d1c3ee356082fbe7fb6f083</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Chemistry</topic><topic>Chemistry and Materials Science</topic><topic>Copper</topic><topic>Current density</topic><topic>Electric circuits</topic><topic>Electrical junctions</topic><topic>Electrochemistry</topic><topic>Industrial Chemistry/Chemical Engineering</topic><topic>Mass transfer</topic><topic>Original Paper</topic><topic>P-type semiconductors</topic><topic>Physical Chemistry</topic><topic>Semiconductors</topic><topic>Straight lines</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bellal, B.</creatorcontrib><creatorcontrib>Hadjarab, B.</creatorcontrib><creatorcontrib>Benreguia, N.</creatorcontrib><creatorcontrib>Bessekhouad, Y.</creatorcontrib><creatorcontrib>Trari, M.</creatorcontrib><collection>CrossRef</collection><collection>Corrosion Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of applied electrochemistry</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bellal, B.</au><au>Hadjarab, B.</au><au>Benreguia, N.</au><au>Bessekhouad, Y.</au><au>Trari, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Photoelectrochemical characterization of the synthetic crednerite CuMnO2</atitle><jtitle>Journal of applied electrochemistry</jtitle><stitle>J Appl Electrochem</stitle><date>2011-07-01</date><risdate>2011</risdate><volume>41</volume><issue>7</issue><spage>867</spage><epage>872</epage><pages>867-872</pages><issn>0021-891X</issn><eissn>1572-8838</eissn><abstract>High quality crednerite CuMnO
2
was prepared by solid state reaction at 950 °C under argon flow. The oxide crystallizes in a monoclinically distorted delafossite structure associated to the static Jahn–Teller (J–T) effect of Mn
3+
ion. Thermal analysis showed that it converts reversibly to spinel Cu
x
Mn
3−
x
O
4
at ~420 °C in air and further heating reform the crednerite above 940 °C. CuMnO
2
is
p
-type, narrow semiconductor band gap with a direct optical gap of 1.31 eV. It exhibits a long-term chemical stability in basic medium (KOH 0.5 M), the semi logarithmic plot gave an exchange current density of 0.2 μA cm
−2
and a corrosion potential of ~−0.1 V
SCE
. The electrochemical oxygen insertion/desinsertion is evidenced from the intensity–potential characteristics. The flat band potential (
V
fb
= −0.26 V
SCE
) and the holes density (
N
A
= 5.12 × 10
18
cm
−3
) were determined, respectively, by extrapolating the curve
C
−
2
versus the potential to the intersection with
C
−
2
= 0 and from the slope of the Mott–Schottky plot. From photoelectrochemical measurements, the valence band formed from Cu-3
d
wave function is positioned at 5.24 ± 0.02 eV below vacuum. The Nyquist representation shows straight line in the high frequency range with an angle of 65° ascribed to Warburg impedance originating from oxygen intercalation and compatible with a system under mass transfer control. The electrochemical junction is modeled by an equivalent electrical circuit thanks to the Randles model.</abstract><cop>Dordrecht</cop><pub>Springer Netherlands</pub><doi>10.1007/s10800-011-0307-y</doi><tpages>6</tpages></addata></record> |
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subjects | Chemistry Chemistry and Materials Science Copper Current density Electric circuits Electrical junctions Electrochemistry Industrial Chemistry/Chemical Engineering Mass transfer Original Paper P-type semiconductors Physical Chemistry Semiconductors Straight lines |
title | Photoelectrochemical characterization of the synthetic crednerite CuMnO2 |
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