Photoelectrochemical characterization of the synthetic crednerite CuMnO2
High quality crednerite CuMnO 2 was prepared by solid state reaction at 950 °C under argon flow. The oxide crystallizes in a monoclinically distorted delafossite structure associated to the static Jahn–Teller (J–T) effect of Mn 3+ ion. Thermal analysis showed that it converts reversibly to spinel Cu...
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Veröffentlicht in: | Journal of applied electrochemistry 2011-07, Vol.41 (7), p.867-872 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | High quality crednerite CuMnO
2
was prepared by solid state reaction at 950 °C under argon flow. The oxide crystallizes in a monoclinically distorted delafossite structure associated to the static Jahn–Teller (J–T) effect of Mn
3+
ion. Thermal analysis showed that it converts reversibly to spinel Cu
x
Mn
3−
x
O
4
at ~420 °C in air and further heating reform the crednerite above 940 °C. CuMnO
2
is
p
-type, narrow semiconductor band gap with a direct optical gap of 1.31 eV. It exhibits a long-term chemical stability in basic medium (KOH 0.5 M), the semi logarithmic plot gave an exchange current density of 0.2 μA cm
−2
and a corrosion potential of ~−0.1 V
SCE
. The electrochemical oxygen insertion/desinsertion is evidenced from the intensity–potential characteristics. The flat band potential (
V
fb
= −0.26 V
SCE
) and the holes density (
N
A
= 5.12 × 10
18
cm
−3
) were determined, respectively, by extrapolating the curve
C
−
2
versus the potential to the intersection with
C
−
2
= 0 and from the slope of the Mott–Schottky plot. From photoelectrochemical measurements, the valence band formed from Cu-3
d
wave function is positioned at 5.24 ± 0.02 eV below vacuum. The Nyquist representation shows straight line in the high frequency range with an angle of 65° ascribed to Warburg impedance originating from oxygen intercalation and compatible with a system under mass transfer control. The electrochemical junction is modeled by an equivalent electrical circuit thanks to the Randles model. |
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ISSN: | 0021-891X 1572-8838 |
DOI: | 10.1007/s10800-011-0307-y |