X-ray diffraction study of ternary layered compounds in the PbSe-Bi2Se3 system

X-ray diffraction study of ternary layered compounds in the PbSe-Bi2Se3 system

The pseudobinary system PbSe-Bi 2 Se 3 has been studied by x-ray diffraction using cleaved single-crystal specimens and powders, and the compositions of the layered compounds existing in this system have been refined. The monoclinic cell parameters of the compounds Pb 5 Bi 6 Se 14 and Pb 5 Bi 12 Se...

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Veröffentlicht in:Inorganic materials 2008-09, Vol.44 (9), p.927-931
Hauptverfasser: Shelimova, L. E., Karpinskii, O. G., Zemskov, V. S.
Format: Artikel
Sprache:eng
Schlagworte:
Chemistry
Chemistry and Materials Science
Diffraction
Industrial Chemistry/Chemical Engineering
Inorganic Chemistry
Inorganic materials
Materials Science
Single crystals
X-rays
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Zusammenfassung:The pseudobinary system PbSe-Bi 2 Se 3 has been studied by x-ray diffraction using cleaved single-crystal specimens and powders, and the compositions of the layered compounds existing in this system have been refined. The monoclinic cell parameters of the compounds Pb 5 Bi 6 Se 14 and Pb 5 Bi 12 Se 23 , belonging to the [(PbSe) 5 ] m [(Bi 2 Se 3 ) 3 ] n homologous series, have been determined.
ISSN:0020-1685
1608-3172
DOI:10.1134/S0020168508090057