Magnetic ordering in CrxHg1 − xSe crystals grown by solid-state recrystallization

Cr x Hg 1 − x crystals grown by solid-state recrystallization have been characterized by electron paramagnetic resonance spectroscopy, transport measurements, and X-ray microanalysis. The results demonstrate that the crystals contain rectangular HgCr 2 Se 4 inclusions elongated along one of their ax...

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Veröffentlicht in:	Inorganic materials 2009-11, Vol.45 (11), p.1230-1233
Hauptverfasser:	Andriichuk, M. D., Belinskii-Slotilo, V. R., Ivanchenko, I. V., Karelin, S. Yu, Makogonenko, V. N., Paranchich, S. Yu, Paranchich, L. D., Romanyuk, V. R., Popenko, N. A., Tkach, V. N.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry Chemistry and Materials Science Chromium Crystals Electrical properties Electron paramagnetic resonance Elongation Inclusions Industrial Chemistry/Chemical Engineering Inorganic Chemistry Materials Science Recrystallization Semiconductors
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Beschreibung
Zusammenfassung:	Cr x Hg 1 − x crystals grown by solid-state recrystallization have been characterized by electron paramagnetic resonance spectroscopy, transport measurements, and X-ray microanalysis. The results demonstrate that the crystals contain rectangular HgCr 2 Se 4 inclusions elongated along one of their axes and irregularly shaped Cr x Hg 1 − x and CrHg inclusions. In the range 77–400 K, the electrical properties of samples cut from different parts of the crystals are typical of semiconductors with a strongly degenerate electron gas.
ISSN:	0020-1685 1608-3172
DOI:	10.1134/S0020168509110077