Optimization of GaMnAs growth in low temperature molecular beam epitaxy

We present a detailed growth optimization procedure and experimental results for the growth of GaMnAs magnetic semiconductors in low-temperature molecular beam epitaxy. They were explored by using in-situ monitoring of the surface reconstruction patterns, double crystal/high-resolution x-ray diffrac...

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Veröffentlicht in:Metals and materials international 2002-04, Vol.8 (2), p.177-181
Hauptverfasser: Kim, Kyung-Hyun, Park, Jong-Hoon, Kim, Byung-Doo, Kim, Chang-Soo, Kim, Dojin, Kim, Hyo-Jin, Ihm, Young-Eon
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Sprache:eng
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Zusammenfassung:We present a detailed growth optimization procedure and experimental results for the growth of GaMnAs magnetic semiconductors in low-temperature molecular beam epitaxy. They were explored by using in-situ monitoring of the surface reconstruction patterns, double crystal/high-resolution x-ray diffraction, conductivity measurement, and superconducting quantum interference device measurements. The results showed strong correlations among the measurements. The room temperature conductivity measurement, in particular, was found to be a useful tool in forecasting the ferromagnetic transition temperature of the films. High quality GaMnAs films could contain Mn up to ≈5% without MnAs segregation at substrate temperatures of 215–275°C. The highest transition temperature of 80 K, however, was measured from the sample with 3.7% Mn grown at the substrate temperature of 250°C and As4 pressure of 1.4×10−6 torr for a growth rate of 0.25 μm/hr.
ISSN:1598-9623
2005-4149
DOI:10.1007/BF03027015