Investigations of surface characterization of silicone rubber due to tracking phenomena under a.c. and d.c. voltages

Investigations of surface characterization of silicone rubber due to tracking phenomena under a.c. and d.c. voltages

In the present work, tracking phenomena has been studied with silicone rubber material under the a.c. and d.c. voltages following IEC-587 standards. The surface condition of the tracked zone was analysed using wide angle X-ray diffraction (WAXD) and thermogravimetric differential thermal analysis (T...

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Veröffentlicht in:Bulletin of materials science 2002-11, Vol.25 (6), p.473-475
Hauptverfasser: Rao, Uma Maheswar, Majeed, S. S. M. S. Abdul, Venkataseshaiah, C., Sarathi, R.
Format: Artikel
Sprache:eng
Schlagworte:
Differential thermal analysis
Diffraction
Electric potential
Silicone rubber
Surface properties
Tracking
Voltage
X-rays
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Zusammenfassung:In the present work, tracking phenomena has been studied with silicone rubber material under the a.c. and d.c. voltages following IEC-587 standards. The surface condition of the tracked zone was analysed using wide angle X-ray diffraction (WAXD) and thermogravimetric differential thermal analysis (TG-DTA) studies. The tracking time was different for a.c. and d.c. voltages.
ISSN:0250-4707
0973-7669
DOI:10.1007/BF02710530