Properties of a silicon surface exposed to nanosecond laser-radiation pulses
Results of the use of nanosecond laser pulses in the technology of production of very-large-scale integration circuits are presented. It is shown that, depending on the conditions of processing of silicon by these pulses, they can avoid mechanical failure of the silicon crystal lattice and form a ge...
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Veröffentlicht in: | Journal of engineering physics and thermophysics 2008-05, Vol.81 (3), p.622-626 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Results of the use of nanosecond laser pulses in the technology of production of very-large-scale integration circuits are presented. It is shown that, depending on the conditions of processing of silicon by these pulses, they can avoid mechanical failure of the silicon crystal lattice and form a gettering layer that cleans the silicon from impurities. |
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ISSN: | 1062-0125 1573-871X |
DOI: | 10.1007/s10891-008-0078-4 |