Dielectric breakdown strength correlation with time-to-failure during wet aging of XLPE-insulated cables
This paper reviews two sets of failure information, the GMTF (a parameter obtained from time-to-failure results) and GMBD stress (a parameter that is calculated from AC breakdown test results), and suggests a correlation. The test results were obtained from accelerated aging experiments on full-size...
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| Veröffentlicht in: | IEEE transactions on power delivery 1999-07, Vol.14 (3), p.750-755 |
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| creator | Walton, M.D. Bernstein, B.S. Thue, W.A. Smith, J.T. |
| description | This paper reviews two sets of failure information, the GMTF (a parameter obtained from time-to-failure results) and GMBD stress (a parameter that is calculated from AC breakdown test results), and suggests a correlation. The test results were obtained from accelerated aging experiments on full-sized medium voltage cables in carefully controlled and monitored water-filled tanks. Results show that the ambient temperature AC breakdown strength for equivalently aged cables is influenced primarily by voltage stress during aging-not by the aging temperature. The AC breakdown strength on equivalently aged cables was also shown to decrease with reductions in the aging voltage at all aging temperatures. |
| doi_str_mv | 10.1109/61.772310 |
| format | Article |
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The test results were obtained from accelerated aging experiments on full-sized medium voltage cables in carefully controlled and monitored water-filled tanks. Results show that the ambient temperature AC breakdown strength for equivalently aged cables is influenced primarily by voltage stress during aging-not by the aging temperature. The AC breakdown strength on equivalently aged cables was also shown to decrease with reductions in the aging voltage at all aging temperatures.</description><subject>Accelerated aging</subject><subject>Applied sciences</subject><subject>Breakdown</subject><subject>Breakdown voltage</subject><subject>Cables</subject><subject>Correlation</subject><subject>Dielectric breakdown</subject><subject>Electric breakdown</subject><subject>Electric connection. Cables. Wiring</subject><subject>Electric potential</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Equivalence</subject><subject>Exact sciences and technology</subject><subject>Mean time to failure</subject><subject>Medium voltage</subject><subject>Strength</subject><subject>Stress</subject><subject>Temperature</subject><subject>Testing</subject><subject>Various equipment and components</subject><subject>Voltage</subject><subject>Voltage control</subject><issn>0885-8977</issn><issn>1937-4208</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkT1vFDEQhq0IJI5AQZvKRRSUYpOZtdcfJQohIJ0EBUh0K693fDHs7Qbbq1P-PXu6U-hCNaOZ532al7F3CFeIYK8VXmldC4QTtkIrdCVrMC_YCoxpKmO1fsVe5_wLACRYWLH7j5EG8iVFz7tE7nc_7UaeS6JxU-65n1KiwZU4jXwXl0OJW6rKVAUXhzkR7-cUxw3fUeFus9-mwH-uv91WcczzEqSee9cNlN-wl8ENmd4e5yn78en2-83nav317svNh3XlhbKlqkETGrBBq64RrrO90V3XB6SugVpJ1IZEY5T0AmXwjewaGxoM1CsC6VGcsvcH70Oa_syUS7uN2dMwuJGmObcWrUVUUi_kxbNkbWoBUtX_B5WtJZi98fIA-jTlnCi0DyluXXpsEdp9Pa3C9lDPwp4fpS57N4TkRh_zv4AxS3Niwc4OWCSip-_R8Rfmj5cl</recordid><startdate>19990701</startdate><enddate>19990701</enddate><creator>Walton, M.D.</creator><creator>Bernstein, B.S.</creator><creator>Thue, W.A.</creator><creator>Smith, J.T.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>7TB</scope><scope>F28</scope><scope>FR3</scope><scope>KR7</scope></search><sort><creationdate>19990701</creationdate><title>Dielectric breakdown strength correlation with time-to-failure during wet aging of XLPE-insulated cables</title><author>Walton, M.D. ; Bernstein, B.S. ; Thue, W.A. ; Smith, J.T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c369t-207e1809f76b53ab9d87bbdf1eb50264178e35864c314fc54b59f51fed6e04c13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Accelerated aging</topic><topic>Applied sciences</topic><topic>Breakdown</topic><topic>Breakdown voltage</topic><topic>Cables</topic><topic>Correlation</topic><topic>Dielectric breakdown</topic><topic>Electric breakdown</topic><topic>Electric connection. Cables. Wiring</topic><topic>Electric potential</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Equivalence</topic><topic>Exact sciences and technology</topic><topic>Mean time to failure</topic><topic>Medium voltage</topic><topic>Strength</topic><topic>Stress</topic><topic>Temperature</topic><topic>Testing</topic><topic>Various equipment and components</topic><topic>Voltage</topic><topic>Voltage control</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Walton, M.D.</creatorcontrib><creatorcontrib>Bernstein, B.S.</creatorcontrib><creatorcontrib>Thue, W.A.</creatorcontrib><creatorcontrib>Smith, J.T.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Civil Engineering Abstracts</collection><jtitle>IEEE transactions on power delivery</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Walton, M.D.</au><au>Bernstein, B.S.</au><au>Thue, W.A.</au><au>Smith, J.T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dielectric breakdown strength correlation with time-to-failure during wet aging of XLPE-insulated cables</atitle><jtitle>IEEE transactions on power delivery</jtitle><stitle>TPWRD</stitle><date>1999-07-01</date><risdate>1999</risdate><volume>14</volume><issue>3</issue><spage>750</spage><epage>755</epage><pages>750-755</pages><issn>0885-8977</issn><eissn>1937-4208</eissn><coden>ITPDE5</coden><abstract>This paper reviews two sets of failure information, the GMTF (a parameter obtained from time-to-failure results) and GMBD stress (a parameter that is calculated from AC breakdown test results), and suggests a correlation. The test results were obtained from accelerated aging experiments on full-sized medium voltage cables in carefully controlled and monitored water-filled tanks. Results show that the ambient temperature AC breakdown strength for equivalently aged cables is influenced primarily by voltage stress during aging-not by the aging temperature. The AC breakdown strength on equivalently aged cables was also shown to decrease with reductions in the aging voltage at all aging temperatures.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/61.772310</doi><tpages>6</tpages></addata></record> |
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| ispartof | IEEE transactions on power delivery, 1999-07, Vol.14 (3), p.750-755 |
| issn | 0885-8977 1937-4208 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Accelerated aging Applied sciences Breakdown Breakdown voltage Cables Correlation Dielectric breakdown Electric breakdown Electric connection. Cables. Wiring Electric potential Electrical engineering. Electrical power engineering Equivalence Exact sciences and technology Mean time to failure Medium voltage Strength Stress Temperature Testing Various equipment and components Voltage Voltage control |
| title | Dielectric breakdown strength correlation with time-to-failure during wet aging of XLPE-insulated cables |
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