Study of the Soft and Hard X-Ray Emitted by APF Plasma Focus Device in Different Pressures

In this paper, an investigation on the X-rays emitted in different pressures by APF plasma focus devices using filtered PIN-diodes and fast plastic scintillation detector is reported. The highest X-ray emission was observed in the pressure of 1.6 torr and the behavior of X-ray intensities registered...

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Veröffentlicht in:Journal of fusion energy 2010-10, Vol.29 (5), p.503-507
Hauptverfasser: Etaati, G. R., Amrollahi, R., Habibi, M., Mohammadi, Kh, Baghdadi, R., Roomi, A.
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container_end_page 507
container_issue 5
container_start_page 503
container_title Journal of fusion energy
container_volume 29
creator Etaati, G. R.
Amrollahi, R.
Habibi, M.
Mohammadi, Kh
Baghdadi, R.
Roomi, A.
description In this paper, an investigation on the X-rays emitted in different pressures by APF plasma focus devices using filtered PIN-diodes and fast plastic scintillation detector is reported. The highest X-ray emission was observed in the pressure of 1.6 torr and the behavior of X-ray intensities registered by different filters versus applied pressure were seemed to be similar. The X-ray angular distribution was bimodal, peaked approximately at ±18°. The intensity of X-rays decreased abruptly along the central axis of the device where the cylindrical plasma pinch was formed.
doi_str_mv 10.1007/s10894-010-9313-z
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subjects Angular distribution
Applied sciences
Cameras
Controled nuclear fusion plants
Cylindrical plasmas
Detectors
Diodes
Emission
Energy
Energy Systems
Energy. Thermal use of fuels
Exact sciences and technology
Experiments
Focus devices
Installations for energy generation and conversion: thermal and electrical energy
Neutrons
Nuclear Energy
Nuclear Fusion
Original Research
Physics
Physics and Astronomy
PIN diodes
Plasma
Plasma focus
Plasma Physics
Plasma pinch
Radiation
Sensors
Sustainable Development
X-rays
title Study of the Soft and Hard X-Ray Emitted by APF Plasma Focus Device in Different Pressures
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