Study of the Soft and Hard X-Ray Emitted by APF Plasma Focus Device in Different Pressures

In this paper, an investigation on the X-rays emitted in different pressures by APF plasma focus devices using filtered PIN-diodes and fast plastic scintillation detector is reported. The highest X-ray emission was observed in the pressure of 1.6 torr and the behavior of X-ray intensities registered by different filters versus applied pressure were seemed to be similar. The X-ray angular distribution was bimodal, peaked approximately at ±18°. The intensity of X-rays decreased abruptly along the central axis of the device where the cylindrical plasma pinch was formed.