Electrocaloric effect of PMN-PT thin films near morphotropic phase boundary
The electrocaloric effect is calculated for PMN-PT relaxor ferroelectric thin film near morphotropic phase boundary composition. Thin film of thickness, ∼240 nm, has been deposited using pulsed laser deposition technique on a highly (111) oriented platinized silicon substrate at 700°C and at 100 mto...
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| Veröffentlicht in: | Bulletin of materials science 2009-06, Vol.32 (3), p.259-262 |
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| container_title | Bulletin of materials science |
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| creator | Saranya, D. Chaudhuri, Ayan Roy Parui, Jayanta Krupanidhi, S. B. |
| description | The electrocaloric effect is calculated for PMN-PT relaxor ferroelectric thin film near morphotropic phase boundary composition. Thin film of thickness, ∼240 nm, has been deposited using pulsed laser deposition technique on a highly (111) oriented platinized silicon substrate at 700°C and at 100 mtorr oxygen partial pressure. Prior to the deposition of PMN-PT, a template layer of LSCO of thickness, ∼60 nm, is deposited on the platinized silicon substrate to hinder the pyrochlore phase formation. The temperature dependent P-E loops were measured at 200 Hz triangular wave operating at the virtual ground mode. Maximum reversible adiabatic temperature change, Δ
T
= 31 K, was calculated at 140°C for an external applied voltage of 18 V. |
| doi_str_mv | 10.1007/s12034-009-0039-3 |
| format | Article |
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T
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T
= 31 K, was calculated at 140°C for an external applied voltage of 18 V.</description><subject>Chemistry and Materials Science</subject><subject>Composition effects</subject><subject>Deposition</subject><subject>Engineering</subject><subject>Ferroelectricity</subject><subject>Materials Science</subject><subject>Mathematical analysis</subject><subject>Partial pressure</subject><subject>Phase boundaries</subject><subject>Pulsed laser deposition</subject><subject>Pulsed lasers</subject><subject>Pyrochlores</subject><subject>Silicon substrates</subject><subject>Temperature dependence</subject><subject>Thickness</subject><subject>Thin films</subject><subject>Voltage</subject><issn>0250-4707</issn><issn>0973-7669</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNp9kUtLxDAUhYMoOI7-AHfFha6qeU3SLGUYHzjqLMZ16CQ3TodOU5N24b83pYIg6OJy74XvHDgchM4JviYYy5tIKGY8x1ilYSpnB2iClWS5FEIdppvOcM4llsfoJMYdxkRxTiboaVGD6YI3Ze1DZTJwLv2Zd9nq-SVfrbNuWzWZq-p9zBooQ7b3od36pGgT3W7LCNnG940tw-cpOnJlHeHse0_R291iPX_Il6_3j_PbZW54IbucGiUFbHihQIBQbkZBzKiUllhGsbS2pBsgyjJFnGRWklJg5YQDao0rGLApuhp92-A_eoid3lfRQF2XDfg-akV4MsSUJfLyX5JxVUiBB_DiF7jzfWhSCl1IJTjlUiWIjJAJPsYATreh2qfgmmA9tKDHFnRqQQ8t6MGYjpqY2OYdwo_x36IvAk2JJQ</recordid><startdate>20090601</startdate><enddate>20090601</enddate><creator>Saranya, D.</creator><creator>Chaudhuri, Ayan Roy</creator><creator>Parui, Jayanta</creator><creator>Krupanidhi, S. 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B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electrocaloric effect of PMN-PT thin films near morphotropic phase boundary</atitle><jtitle>Bulletin of materials science</jtitle><stitle>Bull Mater Sci</stitle><date>2009-06-01</date><risdate>2009</risdate><volume>32</volume><issue>3</issue><spage>259</spage><epage>262</epage><pages>259-262</pages><issn>0250-4707</issn><eissn>0973-7669</eissn><abstract>The electrocaloric effect is calculated for PMN-PT relaxor ferroelectric thin film near morphotropic phase boundary composition. Thin film of thickness, ∼240 nm, has been deposited using pulsed laser deposition technique on a highly (111) oriented platinized silicon substrate at 700°C and at 100 mtorr oxygen partial pressure. Prior to the deposition of PMN-PT, a template layer of LSCO of thickness, ∼60 nm, is deposited on the platinized silicon substrate to hinder the pyrochlore phase formation. The temperature dependent P-E loops were measured at 200 Hz triangular wave operating at the virtual ground mode. Maximum reversible adiabatic temperature change, Δ
T
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| ispartof | Bulletin of materials science, 2009-06, Vol.32 (3), p.259-262 |
| issn | 0250-4707 0973-7669 |
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| source | Indian Academy of Sciences; Springer Nature - Complete Springer Journals; Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Free Full-Text Journals in Chemistry; ProQuest Central |
| subjects | Chemistry and Materials Science Composition effects Deposition Engineering Ferroelectricity Materials Science Mathematical analysis Partial pressure Phase boundaries Pulsed laser deposition Pulsed lasers Pyrochlores Silicon substrates Temperature dependence Thickness Thin films Voltage |
| title | Electrocaloric effect of PMN-PT thin films near morphotropic phase boundary |
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