12 GHz F rm MAX GaN/AlN/AlGaN Nanowire MISFET

GaN/AlN/AlGaN/GaN nanowire metal-insulator-semiconductor field-effect transistors (MISFETs) have been fabricated for the first time with submicrometer gate lengths. Their microwave performances were investigated. An intrinsic current-gain cutoff frequency (F sub(T)) of 5 GHz as well as an intrinsic...

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Veröffentlicht in:IEEE electron device letters 2009-01, Vol.30 (4)
Hauptverfasser: Vandenbrouck, S, Madjour, K, Theron, D, Yajie Dong, Yajie Dong, Yat Li, Yat Li, Lieber, C M, Gaquiere, C
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Sprache:eng
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Zusammenfassung:GaN/AlN/AlGaN/GaN nanowire metal-insulator-semiconductor field-effect transistors (MISFETs) have been fabricated for the first time with submicrometer gate lengths. Their microwave performances were investigated. An intrinsic current-gain cutoff frequency (F sub(T)) of 5 GHz as well as an intrinsic maximum available gain (F sub(MAX)) cutoff frequency of 12 GHz have been obtained for the first time and associated with a gate length of 0.5 mum. These results show the great potentiality of GaN-based nanowire FETs for microwave applications.
ISSN:0741-3106
DOI:10.1109/LED.2009.2014791