Reduction of scattering loss of silicon slot waveguides by RCA smoothing

Because of stronger optical confinement density, silicon slot waveguides tend to have higher scattering loss than normal ridge waveguides with same sidewall roughness. A wet chemical process is found to be highly effective in reducing the surface roughness and scattering loss. A reduction in scatter...

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Veröffentlicht in:Optics letters 2012-01, Vol.37 (1), p.13-15
Hauptverfasser: Sun, Haishan, Chen, Antao, Abeysinghe, Don, Szep, Attila, Kim, Richard S
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container_issue 1
container_start_page 13
container_title Optics letters
container_volume 37
creator Sun, Haishan
Chen, Antao
Abeysinghe, Don
Szep, Attila
Kim, Richard S
description Because of stronger optical confinement density, silicon slot waveguides tend to have higher scattering loss than normal ridge waveguides with same sidewall roughness. A wet chemical process is found to be highly effective in reducing the surface roughness and scattering loss. A reduction in scattering loss by 10.2 dB/cm for TE and 8.5 dB/cm for TM polarizations has been achieved.
doi_str_mv 10.1364/ol.37.000013
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_913719297</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1031333690</sourcerecordid><originalsourceid>FETCH-LOGICAL-c389t-a5cb6a8e73954c637ecadd58410846f0afccd81d7e5965de3d28af9d368f945b3</originalsourceid><addsrcrecordid>eNp90M1LwzAYBvAgipvTm2fpTQ92Jn3z0RxHUScMBkPPJU3SWWmX2aTK_nujmx7N5YW8vzyQB6FLgqcEOL1z7RTEFMdD4AiNCQOZUiHpMRpjQnkqmcxG6Mz7t0i4ADhFoyzLSCYEG6P5yppBh8ZtElcnXqsQbN9s1knrvP-5atpGx61vXUg-1YddD42xPql2yaqYJb5zLrzGB-fopFattxeHOUEvD_fPxTxdLB-fitki1ZDLkCqmK65yK0AyqjkIq5UxLKcE55TXWNVam5wYYZnkzFgwWa5qaYDntaSsggm63udue_c-WB_KrvHatq3aWDf4UhIQRGZSRHnzryQYCABwiSO93VPdx2_3ti63fdOpfhdR-d1yuVyUIMp9y5FfHZKHqrPmD__WCl9BOHdX</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1031333690</pqid></control><display><type>article</type><title>Reduction of scattering loss of silicon slot waveguides by RCA smoothing</title><source>Optica Publishing Group Journals</source><creator>Sun, Haishan ; Chen, Antao ; Abeysinghe, Don ; Szep, Attila ; Kim, Richard S</creator><creatorcontrib>Sun, Haishan ; Chen, Antao ; Abeysinghe, Don ; Szep, Attila ; Kim, Richard S</creatorcontrib><description>Because of stronger optical confinement density, silicon slot waveguides tend to have higher scattering loss than normal ridge waveguides with same sidewall roughness. A wet chemical process is found to be highly effective in reducing the surface roughness and scattering loss. A reduction in scattering loss by 10.2 dB/cm for TE and 8.5 dB/cm for TM polarizations has been achieved.</description><identifier>ISSN: 0146-9592</identifier><identifier>EISSN: 1539-4794</identifier><identifier>DOI: 10.1364/ol.37.000013</identifier><identifier>PMID: 22212775</identifier><language>eng</language><publisher>United States</publisher><subject>Density ; Noise levels ; Reduction ; Ridges ; Scattering ; Silicon ; Surface roughness ; Waveguides</subject><ispartof>Optics letters, 2012-01, Vol.37 (1), p.13-15</ispartof><rights>2012 Optical Society of America</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c389t-a5cb6a8e73954c637ecadd58410846f0afccd81d7e5965de3d28af9d368f945b3</citedby><cites>FETCH-LOGICAL-c389t-a5cb6a8e73954c637ecadd58410846f0afccd81d7e5965de3d28af9d368f945b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,3258,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/22212775$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Sun, Haishan</creatorcontrib><creatorcontrib>Chen, Antao</creatorcontrib><creatorcontrib>Abeysinghe, Don</creatorcontrib><creatorcontrib>Szep, Attila</creatorcontrib><creatorcontrib>Kim, Richard S</creatorcontrib><title>Reduction of scattering loss of silicon slot waveguides by RCA smoothing</title><title>Optics letters</title><addtitle>Opt Lett</addtitle><description>Because of stronger optical confinement density, silicon slot waveguides tend to have higher scattering loss than normal ridge waveguides with same sidewall roughness. A wet chemical process is found to be highly effective in reducing the surface roughness and scattering loss. A reduction in scattering loss by 10.2 dB/cm for TE and 8.5 dB/cm for TM polarizations has been achieved.</description><subject>Density</subject><subject>Noise levels</subject><subject>Reduction</subject><subject>Ridges</subject><subject>Scattering</subject><subject>Silicon</subject><subject>Surface roughness</subject><subject>Waveguides</subject><issn>0146-9592</issn><issn>1539-4794</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNp90M1LwzAYBvAgipvTm2fpTQ92Jn3z0RxHUScMBkPPJU3SWWmX2aTK_nujmx7N5YW8vzyQB6FLgqcEOL1z7RTEFMdD4AiNCQOZUiHpMRpjQnkqmcxG6Mz7t0i4ADhFoyzLSCYEG6P5yppBh8ZtElcnXqsQbN9s1knrvP-5atpGx61vXUg-1YddD42xPql2yaqYJb5zLrzGB-fopFattxeHOUEvD_fPxTxdLB-fitki1ZDLkCqmK65yK0AyqjkIq5UxLKcE55TXWNVam5wYYZnkzFgwWa5qaYDntaSsggm63udue_c-WB_KrvHatq3aWDf4UhIQRGZSRHnzryQYCABwiSO93VPdx2_3ti63fdOpfhdR-d1yuVyUIMp9y5FfHZKHqrPmD__WCl9BOHdX</recordid><startdate>20120101</startdate><enddate>20120101</enddate><creator>Sun, Haishan</creator><creator>Chen, Antao</creator><creator>Abeysinghe, Don</creator><creator>Szep, Attila</creator><creator>Kim, Richard S</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope></search><sort><creationdate>20120101</creationdate><title>Reduction of scattering loss of silicon slot waveguides by RCA smoothing</title><author>Sun, Haishan ; Chen, Antao ; Abeysinghe, Don ; Szep, Attila ; Kim, Richard S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c389t-a5cb6a8e73954c637ecadd58410846f0afccd81d7e5965de3d28af9d368f945b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Density</topic><topic>Noise levels</topic><topic>Reduction</topic><topic>Ridges</topic><topic>Scattering</topic><topic>Silicon</topic><topic>Surface roughness</topic><topic>Waveguides</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sun, Haishan</creatorcontrib><creatorcontrib>Chen, Antao</creatorcontrib><creatorcontrib>Abeysinghe, Don</creatorcontrib><creatorcontrib>Szep, Attila</creatorcontrib><creatorcontrib>Kim, Richard S</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Optics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sun, Haishan</au><au>Chen, Antao</au><au>Abeysinghe, Don</au><au>Szep, Attila</au><au>Kim, Richard S</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reduction of scattering loss of silicon slot waveguides by RCA smoothing</atitle><jtitle>Optics letters</jtitle><addtitle>Opt Lett</addtitle><date>2012-01-01</date><risdate>2012</risdate><volume>37</volume><issue>1</issue><spage>13</spage><epage>15</epage><pages>13-15</pages><issn>0146-9592</issn><eissn>1539-4794</eissn><abstract>Because of stronger optical confinement density, silicon slot waveguides tend to have higher scattering loss than normal ridge waveguides with same sidewall roughness. A wet chemical process is found to be highly effective in reducing the surface roughness and scattering loss. A reduction in scattering loss by 10.2 dB/cm for TE and 8.5 dB/cm for TM polarizations has been achieved.</abstract><cop>United States</cop><pmid>22212775</pmid><doi>10.1364/ol.37.000013</doi><tpages>3</tpages></addata></record>
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subjects Density
Noise levels
Reduction
Ridges
Scattering
Silicon
Surface roughness
Waveguides
title Reduction of scattering loss of silicon slot waveguides by RCA smoothing
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T06%3A44%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Reduction%20of%20scattering%20loss%20of%20silicon%20slot%20waveguides%20by%20RCA%20smoothing&rft.jtitle=Optics%20letters&rft.au=Sun,%20Haishan&rft.date=2012-01-01&rft.volume=37&rft.issue=1&rft.spage=13&rft.epage=15&rft.pages=13-15&rft.issn=0146-9592&rft.eissn=1539-4794&rft_id=info:doi/10.1364/ol.37.000013&rft_dat=%3Cproquest_cross%3E1031333690%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1031333690&rft_id=info:pmid/22212775&rfr_iscdi=true