Cryogenic sapphire oscillator with exceptionally high frequency stability

Extremely high short-term frequency stability has been realized in microwave oscillators based on liquid-helium-cooled sapphire dielectric resonators with a modified mounting structure. These oscillators have exhibited an Allan deviation of about 5.4/spl times/10/sup -16//spl tau//sup -1/2/ for inte...

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Veröffentlicht in:IEEE transactions on instrumentation and measurement 2001-04, Vol.50 (2), p.519-521
Hauptverfasser: Mann, A.G., Sheng, C., Luiten, A.N.
Format: Artikel
Sprache:eng
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Zusammenfassung:Extremely high short-term frequency stability has been realized in microwave oscillators based on liquid-helium-cooled sapphire dielectric resonators with a modified mounting structure. These oscillators have exhibited an Allan deviation of about 5.4/spl times/10/sup -16//spl tau//sup -1/2/ for integration times (/spl tau/) of 1 to 4 s and a minimum of 2.4/spl times/10/sup -16/ at 32 s. For integration times longer than 100 s, the frequency stability is approximately 3/spl times/10/sup -17//spl tau//sup 1/2/, and the relative drift per day is about 10/sup -13/. This stability is the best reported to date for any microwave source over integration times less than 100 s.
ISSN:0018-9456
1557-9662
DOI:10.1109/19.918181